{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,21]],"date-time":"2026-07-21T15:37:25Z","timestamp":1784648245339,"version":"3.55.0"},"reference-count":34,"publisher":"MDPI AG","issue":"21","license":[{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Task of Ministry of Education and Science and performed at large-scale research facilities \u201cBeam-M\u201d of Bauman Moscow State Technical University (BMSTU)"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Nanomaterials"],"abstract":"<jats:p>Thin-layer Al\/MgF2 coatings are currently used for extraterrestrial far-UV astronomy as the primary and secondary mirrors of telescopes (such as \u201cSpektr-UF\u201d). Successful Hubble far-UV measurements have been performed thanks to MgF2 on Al mirror coatings. Damage of such thin-layer coatings has been previously studied under exposure to high-energy electrons\/protons fluxes and in low Earth orbit environments. Meanwhile, there is an interest to test the stability of such mirrors under the impact of extreme radiation fluxes from pulsed plasma thrusters as a simulation of emergency onboard situations and other applications. In the present studies, the high current and compressed plasma jets were generated by a laboratory plasma thruster prototype and operated as effective emitters of high brightness (with an integral overall wavelength radiation flux of &gt;1 MW\/cm2) and broadband radiation. The spectrum rearrangement and hard-photon cut-off at energy above Ec were implemented by selection of a background gas in the discharge chamber. The discharges in air (Ec \u2248 6 eV), argon (Ec \u2248 15 eV) and neon (Ec \u2248 21 eV) were studied. X-ray diffraction and reflectometry, electron and atomic force microscopy, and IR and visible spectroscopy were used for coating characterization and estimation of degradation degree. In the case of the discharges in air with photon energies of E &lt; 6 eV, only individual nanocracks were found and property changes were negligible. In the case of inert gases, the energy fraction was \u224850% in the VUV range. As found for inert background gases, an emission of such hard photons with energies higher than the MgF2 band gap energy of \u224810.8 eV caused a drastic light-induced ablation and degradation of the irradiated coatings. The upward trend of degradation with an increasing of the maximum photon energies was detected. The obtained data on the surface destruction are useful for the design of methods for coating stability tests and an understanding of the consequences of emergencies onboard space research stations.<\/jats:p>","DOI":"10.3390\/nano13212819","type":"journal-article","created":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T06:29:01Z","timestamp":1698128941000},"page":"2819","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Surface Degradation of Thin-Layer Al\/MgF2 Mirrors under Exposure to Powerful VUV Radiation"],"prefix":"10.3390","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8578-2632","authenticated-orcid":false,"given":"Andrei","family":"Skriabin","sequence":"first","affiliation":[{"name":"Department of Power Engineering, Bauman Moscow State Technical University, Moscow 105005, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3270-2122","authenticated-orcid":false,"given":"Victor","family":"Telekh","sequence":"additional","affiliation":[{"name":"Department of Power Engineering, Bauman Moscow State Technical University, Moscow 105005, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6593-634X","authenticated-orcid":false,"given":"Aleksei","family":"Pavlov","sequence":"additional","affiliation":[{"name":"Department of Power Engineering, Bauman Moscow State Technical University, Moscow 105005, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daria","family":"Pasynkova","sequence":"additional","affiliation":[{"name":"Department of Power Engineering, Bauman Moscow State Technical University, Moscow 105005, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anastasiya","family":"Podlosinskaya","sequence":"additional","affiliation":[{"name":"Department of Power Engineering, Bauman Moscow State Technical University, Moscow 105005, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pavel","family":"Novikov","sequence":"additional","affiliation":[{"name":"Luch Scientific Production Association, Podolsk 142103, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Valery","family":"Zhupanov","sequence":"additional","affiliation":[{"name":"Luch Scientific Production Association, Podolsk 142103, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dmitry","family":"Chesnokov","sequence":"additional","affiliation":[{"name":"Luch Scientific Production Association, Podolsk 142103, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Viacheslav","family":"Senkov","sequence":"additional","affiliation":[{"name":"Lebedev Physical Institute of the Russian Academy of Sciences, Moscow 119991, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alexander","family":"Turyanskiy","sequence":"additional","affiliation":[{"name":"Lebedev Physical Institute of the Russian Academy of Sciences, Moscow 119991, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2023,10,24]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"124","DOI":"10.1117\/12.425117","article-title":"Interference multilayer antireflection coatings for two wavelengths in the near infra red","volume":"4397","author":"Pencheva","year":"2001","journal-title":"Proc. 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