{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,28]],"date-time":"2026-07-28T04:03:54Z","timestamp":1785211434324,"version":"3.55.0"},"reference-count":68,"publisher":"MDPI AG","issue":"24","license":[{"start":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T00:00:00Z","timestamp":1765411200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003032","name":"Association Nationale de la Recherche et de la Technologie","doi-asserted-by":"publisher","award":["2022\/1577"],"award-info":[{"award-number":["2022\/1577"]}],"id":[{"id":"10.13039\/501100003032","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014132","name":"European Metrology Programme for Innovation and Research","doi-asserted-by":"publisher","award":["19NRM04"],"award-info":[{"award-number":["19NRM04"]}],"id":[{"id":"10.13039\/100014132","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Nanomaterials"],"abstract":"<jats:p>Although graphene promises a wide range of applications, large-scale production of this material remains complex. One very common way of obtaining graphene is through a reduction in graphene oxide (GO). In order to fully control this production process, it is necessary to obtain data from different techniques, but a comprehensive characterization methodology and associated metrology are currently lacking. Here, we propose tools for substrate selection (in this study, the most appropriate were silicon and silicon dioxide on silicon) and precautions to be taken when setting up a correlative metrology method integrating atomic force microscopy (AFM), scanning electron microscopy (SEM), Raman microscopy\/spectroscopy, scanning microwave microscopy (SMM) and scanning thermal microscopy (SThM). Indeed, in order to obtain reliable data for each of these techniques applied to a unique graphene oxide flake, a strategy must be developed and could be implemented to monitor the reduction in GO. Emphasis was placed on the choice of the substrate and on the possible degradations generated by each of the techniques employed, and a running sequence was determined.<\/jats:p>","DOI":"10.3390\/nano15241861","type":"journal-article","created":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T12:57:41Z","timestamp":1765457861000},"page":"1861","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study\u2014Sample Preparation and Stability Issues"],"prefix":"10.3390","volume":"15","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-4046-4897","authenticated-orcid":false,"given":"Lydia","family":"Chibane","sequence":"first","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"},{"name":"Centre Inter-Universitaire de Recherche et d\u2019Ing\u00e9nierie des Mat\u00e9riaux Universit\u00e9 de Toulouse, Toulouse INP, Centre National de la Recherche Scientifique, 118 Route de Narbonne, 31062 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8908-0742","authenticated-orcid":false,"given":"Alexandra","family":"Delvall\u00e9e","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3543-3117","authenticated-orcid":false,"given":"Nolwenn","family":"Fleurence","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sarah","family":"Douri","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6352-6040","authenticated-orcid":false,"given":"Jos\u00e9","family":"Mor\u00e1n-Meza","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9814-0535","authenticated-orcid":false,"given":"Christian","family":"Ulysse","sequence":"additional","affiliation":[{"name":"Centre de Nanosciences et de Nanotechnologies, CNRS, 10 Bd Thomas Gobert, 91120 Palaiseau, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7950-0475","authenticated-orcid":false,"given":"Fran\u00e7ois","family":"Piquemal","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0071-5527","authenticated-orcid":false,"given":"Nicolas","family":"Feltin","sequence":"additional","affiliation":[{"name":"Laboratoire National de M\u00e9trologie et D\u2019Essais (LNE), 29 Avenue Roger Hennequin, 78190 Trappes, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8344-6902","authenticated-orcid":false,"given":"Emmanuel","family":"Flahaut","sequence":"additional","affiliation":[{"name":"Centre Inter-Universitaire de Recherche et d\u2019Ing\u00e9nierie des Mat\u00e9riaux Universit\u00e9 de Toulouse, Toulouse INP, Centre National de la Recherche Scientifique, 118 Route de Narbonne, 31062 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2025,12,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"102732","DOI":"10.1016\/j.nantod.2025.102732","article-title":"Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research","volume":"63","author":"Kleibert","year":"2025","journal-title":"Nano Today"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"18227","DOI":"10.1021\/acsnano.4c17838","article-title":"High-Resolution Correlative Microscopy Approach for Nanobio Interface Studies of Nanoparticle-Induced Lung Epithelial Cell Damage","volume":"19","author":"Podlipec","year":"2025","journal-title":"ACS Nano"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"041314","DOI":"10.1063\/5.0287947","article-title":"Advances in correlative microscopy and next-generation devices toward the CHIPS Act","volume":"12","author":"Schwalb","year":"2025","journal-title":"Appl. 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