{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T11:45:31Z","timestamp":1790423131770,"version":"4.1.0"},"reference-count":72,"publisher":"MDPI AG","issue":"24","license":[{"start":{"date-parts":[[2021,12,16]],"date-time":"2021-12-16T00:00:00Z","timestamp":1639612800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Euratom research and training program 2014-2018","award":["755183"],"award-info":[{"award-number":["755183"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Polymers"],"abstract":"<jats:p>The radio-thermal ageing of silane-crosslinked polyethylene (Si-XLPE) was studied in air under different \u03b3 dose rates (6.0, 8.5, 77.8, and 400 Gy\u00b7h\u22121) at different temperatures (21, 47, and 86 \u00b0C). The changes in the physico-chemical and electrical properties of Si-XLPE throughout its exposure were determined using Fourier transform infrared spectroscopy coupled with chemical gas derivatization, hydrostatic weighing, differential scanning calorimetry, dielectric spectroscopy and current measurements under an applied electric field. From a careful analysis of the oxidation products, it was confirmed that ketones are the main oxidation products in Si-XLPE. The analytical kinetic model for radio-thermal oxidation was thus completed with relatively simple structure\u2013property relationships in order to additionally predict the increase in density induced by oxidation, and the adverse changes in two electrical properties of Si-XLPE: the dielectric constant \u03b5\u2032 and volume resistivity R. After having shown the reliability of these new kinetic developments, the lifetime of Si-XLPE was determined using a dielectric end-of-life criterion deduced from a literature compilation on the changes in R with \u03b5\u2032 for common polymers. The corresponding lifetime was found to be at least two times longer than the lifetime previously determined with the conventional end-of-life criterion, i.e., the mechanical type, thus confirming the previous literature studies that had shown that fracture properties degrade faster than electrical properties.<\/jats:p>","DOI":"10.3390\/polym13244427","type":"journal-article","created":{"date-parts":[[2021,12,16]],"date-time":"2021-12-16T21:32:40Z","timestamp":1639690360000},"page":"4427","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":25,"title":["Towards a Kinetic Modeling of the Changes in the Electrical Properties of Cable Insulation during Radio-Thermal Ageing in Nuclear Power Plants. Application to Silane-Crosslinked Polyethylene"],"prefix":"10.3390","volume":"13","author":[{"given":"Sarah","family":"Hettal","sequence":"first","affiliation":[{"name":"Laboratoire Proc\u00e9d\u00e9s et Ing\u00e9nierie en M\u00e9canique et Mat\u00e9riaux, Arts et M\u00e9tiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l\u2019H\u00f4pital, 75013 Paris, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6258-5284","authenticated-orcid":false,"given":"Simone Vincenzo","family":"Suraci","sequence":"additional","affiliation":[{"name":"LIMES, Department of Electrical, Electronic and Information Engineering, University of Bologna, Viale del Risorgimento, 40136 Bologna, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S\u00e9bastien","family":"Roland","sequence":"additional","affiliation":[{"name":"Laboratoire Proc\u00e9d\u00e9s et Ing\u00e9nierie en M\u00e9canique et Mat\u00e9riaux, Arts et M\u00e9tiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l\u2019H\u00f4pital, 75013 Paris, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4843-5508","authenticated-orcid":false,"given":"Davide","family":"Fabiani","sequence":"additional","affiliation":[{"name":"LIMES, Department of Electrical, Electronic and Information Engineering, University of Bologna, Viale del Risorgimento, 40136 Bologna, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7768-9000","authenticated-orcid":false,"given":"Xavier","family":"Colin","sequence":"additional","affiliation":[{"name":"Laboratoire Proc\u00e9d\u00e9s et Ing\u00e9nierie en M\u00e9canique et Mat\u00e9riaux, Arts et M\u00e9tiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l\u2019H\u00f4pital, 75013 Paris, France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2021,12,16]]},"reference":[{"key":"ref_1","unstructured":"IAEA-TECDOC-1402 (2004). 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