{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,9]],"date-time":"2026-10-09T15:18:54Z","timestamp":1791559134987,"version":"4.3.4"},"reference-count":44,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T00:00:00Z","timestamp":1768867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Education Department of Liaoning Province","award":["24-1097"],"award-info":[{"award-number":["24-1097"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Printed circuit boards (PCBs) are critical in the electronics industry. As PCB layouts grow increasingly complex, defect detection processes often encounter challenges such as low image contrast, uneven brightness, minute defect sizes, and irregular shapes, making it difficult to achieve rapid and accurate automated inspection. To address these challenges, this paper proposes a novel object detector, YOLO-UMS, designed to enhance the accuracy and speed of PCB surface defect detection. First, a lightweight plug-and-play Unified Multi-Scale Feature Fusion Pyramid Network (UMSFPN) is proposed to process and fuse multi-scale information across different resolution layers. The UMSFPN uses a Cross-Stage Partial Multi-Scale Module (CSPMS) and an optimized fusion strategy. This approach balances the integration of fine-grained edge information from shallow layers and coarse-grained semantic details from deep layers. Second, the paper introduces a lightweight RG-ELAN module, based on the ELAN network, to enhance feature extraction for small targets in complex scenes. The RG-ELAN module uses low-cost operations to generate redundant feature maps and reduce computational complexity. Finally, the Adaptive Interaction Feature Integration (AIFI) module enriches high-level features by eliminating redundant interactions among shallow-layer features. The channel-priority convolutional attention module (CPCA), deployed in the detection head, strengthens the expressive power of small target features. The experimental results show that the new UMSFPN neck can help improve the AP50 by 3.1% and AP by 2% on the self-collected dataset PCB-M, which is better than the original PAFPN neck. Meanwhile, UMSFPN achieves excellent results across different detectors and datasets, verifying its broad applicability. Without pre-training weights, YOLO-UMS achieves an 84% AP50 on the PCB-M dataset, which is a 6.4% improvement over the baseline YOLO11. Comparing results with existing target detection algorithms shows that the algorithm exhibits good performance in terms of detection accuracy. It provides a feasible solution for efficient and accurate detection of PCB surface defects in the industry.<\/jats:p>","DOI":"10.3390\/s26020689","type":"journal-article","created":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T14:57:58Z","timestamp":1768921078000},"page":"689","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["YOLO-UMS: Multi-Scale Feature Fusion Based on YOLO Detector for PCB Surface Defect Detection"],"prefix":"10.3390","volume":"26","author":[{"given":"Hong","family":"Peng","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, Liaoning Technical University, Huludao 125105, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenjie","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Liaoning Technical University, Huludao 125105, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baocai","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Liaoning Technical University, Huludao 125105, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2026,1,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Li, Z., and Yang, Q. 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