{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T12:10:58Z","timestamp":1779192658195,"version":"3.51.4"},"reference-count":18,"publisher":"MDPI AG","issue":"10","license":[{"start":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T00:00:00Z","timestamp":1779148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Multi-source Sensor Information Fusion for Safety Early Warning of New Energy Vehicles","award":["2025MK056"],"award-info":[{"award-number":["2025MK056"]}]},{"name":"Research on Key Sensor Testing Technology for Unmanned Delivery Vehicles in Typical Traffic Scenarios","award":["LGC22E050004"],"award-info":[{"award-number":["LGC22E050004"]}]},{"name":"Reliability Improvement and Experimental Evaluation of Multi-objective Radar Speedometer","award":["ZC2023001"],"award-info":[{"award-number":["ZC2023001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Multi-target radar speed measuring instruments play a crucial role in monitoring speeding violations of multiple targets in multiple lanes, ensuring the safety, order, and efficient operation of traffic. In order to verify the stability of these instruments under long-term and complex working conditions, accelerated life testing was conducted, and the failure mechanisms of the radar were studied using optical and scanning electron microscopic analysis methods. The results indicated that at a test temperature of 85 \u00b0C and humidity of 79% RH, all five speed measuring specimens failed after testing for 55 days. The primary cause of failure was the malfunction of the microwave signal receiving chip in the radar speed module under the combination of temperature and humidity. The failure modes of the chip were mainly related to its structure, design, selection of soldering materials, and soldering process. This study provides references and insights for the reliability research of other metrological instrument products.<\/jats:p>","DOI":"10.3390\/s26103209","type":"journal-article","created":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T11:53:10Z","timestamp":1779191590000},"page":"3209","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Multi-Target Radar Speed Meter Failure Mechanism Research"],"prefix":"10.3390","volume":"26","author":[{"given":"Lei","family":"Luo","sequence":"first","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Jiang","sequence":"additional","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianwen","family":"Shao","sequence":"additional","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical and Power Engineering, Nanjing Tech University, Nanjing 211816, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cunbin","family":"Zhao","sequence":"additional","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaomin","family":"Shen","sequence":"additional","affiliation":[{"name":"Zhejiang Institute of Quality Sciences, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Digital Precision Measurement Technology, Hangzhou 310018, China"},{"name":"Zhejiang Key Laboratory of Acoustic Intelligent Sensing and Advanced Measurement, Hangzhou 310018, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2026,5,19]]},"reference":[{"key":"ref_1","unstructured":"(2009). Reliability Qualification and Acceptance Testing (Standard No. GJB899A-2009)."},{"key":"ref_2","unstructured":"(1986). Equipment Reliability Testing\u2014Verification Test Plans for Failure Rate and Mean Time Between Failures Under the Assumption of Constant Failure Rate (Standard No. GB5080.7-1986)."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"468","DOI":"10.1002\/nav.21545","article-title":"Design of accelerated life testing plans under multiple stresses","volume":"60","author":"Zhu","year":"2013","journal-title":"Nav. Res. Logist."},{"key":"ref_4","first-page":"109","article-title":"Statistical analysis of life tests and accelerated tests under log-normal distribution timed censored samples","volume":"17","author":"Wang","year":"1994","journal-title":"Acta Math. Appl. Sin."},{"key":"ref_5","first-page":"48","article-title":"Accelerated life test study on residual life calculation model of friction welded joints for boiler serpentine tubes","volume":"22","author":"Zhao","year":"2002","journal-title":"Proc. CSEE"},{"key":"ref_6","first-page":"73","article-title":"Statistical analysis of step-stress accelerated life tests under Weibull distribution","volume":"3","author":"Xu","year":"1999","journal-title":"Oper. Res. Trans."},{"key":"ref_7","unstructured":"Mao, S.S., and Wang, L.L. (1997). Accelerated Life Testing, Science Press."},{"key":"ref_8","first-page":"77","article-title":"Analysis and discussion on accelerated life test standards for electricity meters","volume":"40","author":"Yu","year":"2022","journal-title":"Electron. Prod. Reliab. Environ. Test."},{"key":"ref_9","first-page":"45","article-title":"Research on environmental adaptability protection methods for radar equipment in coastal areas","volume":"3","author":"Song","year":"2019","journal-title":"Mod. Inf. Technol."},{"key":"ref_10","first-page":"18","article-title":"Research on failure modes and quality assurance of microwave multi-chip modules","volume":"42","author":"Zhang","year":"2024","journal-title":"Electron. Prod. Reliab. Environ. Test."},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"012040","DOI":"10.1088\/1742-6596\/679\/1\/012040","article-title":"A review of the technology and process on integrated circuits failure analysis applied in communications products","volume":"679","author":"Ming","year":"2016","journal-title":"J. Phys. Conf."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"1234","DOI":"10.1016\/j.microrel.2015.05.005","article-title":"Interfacial reaction and failure mode analysis of the solder joints for flip-chip LED on ENIG and Cu-OSP surface finishes","volume":"55","author":"Liu","year":"2015","journal-title":"Microelectron. Reliab."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"3451","DOI":"10.1016\/j.jmrt.2022.10.116","article-title":"Failure analysis on silicon semiconductor device materials: Optical and high-resolution microscopic assessments","volume":"21","author":"Gopinath","year":"2022","journal-title":"J. Mater. Res. Technol."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"185","DOI":"10.1109\/PROC.1974.9408","article-title":"The reliability of semiconductor devices in the bell system","volume":"62","author":"Peck","year":"1974","journal-title":"Proc. IEEE"},{"key":"ref_15","first-page":"106","article-title":"Performance and Life of Glass Fiber Reinforced PC Based on Hallberg-Peck Model","volume":"50","author":"Lu","year":"2022","journal-title":"Plast. Ind."},{"key":"ref_16","first-page":"931","article-title":"A study of the effects of cyclic thermal stresses on a ductile metal","volume":"76","author":"Coffin","year":"1954","journal-title":"Trans. ASME"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"115366","DOI":"10.1016\/j.microrel.2024.115366","article-title":"Bayesian calibration of ball grid array lifetime models for solder fatigue","volume":"157","author":"Tauscher","year":"2024","journal-title":"Microelectron. Reliab."},{"key":"ref_18","unstructured":"(2012). Program of Pattern Evaluation of Fixed-angle Radar Speed Measurement Devices (Standard No. JJF 1335-2012)."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/26\/10\/3209\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T12:01:16Z","timestamp":1779192076000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/26\/10\/3209"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,19]]},"references-count":18,"journal-issue":{"issue":"10","published-online":{"date-parts":[[2026,5]]}},"alternative-id":["s26103209"],"URL":"https:\/\/doi.org\/10.3390\/s26103209","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,5,19]]}}}