{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T09:10:37Z","timestamp":1783933837290,"version":"3.55.0"},"reference-count":47,"publisher":"MDPI AG","issue":"14","license":[{"start":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T00:00:00Z","timestamp":1783900800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper presents an order statistic approach to the time distribution of the first detected event following a primary avalanche pulse, considering a mixture of correlated and primary dark counts. The well-known order statistic method, commonly used to describe the time resolution of scintillation detectors, is applied to the arrival times of correlated events. The established model of crosstalk as a branching Poisson process is extended to afterpulsing, and correlated events are analyzed starting from their initial seeds\u2014free (detrapped or diffused) charge carriers capable of triggering secondary avalanche breakdowns. The proposed approach enables the extraction of true timing information for delayed crosstalk and afterpulsing and predicts a narrowing of the first arrival time distribution as the number of seeds and the probability of correlated events increase.<\/jats:p>","DOI":"10.3390\/s26144432","type":"journal-article","created":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T08:53:58Z","timestamp":1783932838000},"page":"4432","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["First-Order Statistic of Afterpulsing and Crosstalk Events in Silicon Photomultipliers"],"prefix":"10.3390","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0077-7496","authenticated-orcid":false,"given":"Sergey","family":"Vinogradov","sequence":"first","affiliation":[{"name":"P.N. Lebedev Physical Institute of the Russian Academy of Sciences, Leninskiy Prospekt 53, Moscow 119991, Russia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2026,7,13]]},"reference":[{"key":"ref_1","first-page":"56","article-title":"Scintillation spectrometer statistics","volume":"4","author":"Breitenberger","year":"1955","journal-title":"Prog. Nucl. Phys."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"195","DOI":"10.1016\/0029-554X(68)90411-4","article-title":"Measurement by two-dimensional pulse analysis of the time and energy distributions of afterpulses in proportional counters","volume":"60","author":"Genz","year":"1968","journal-title":"Nucl. Instrum. Methods"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"5794","DOI":"10.1063\/1.1143365","article-title":"Afterpulse measurement and correction","volume":"63","author":"Campbell","year":"1992","journal-title":"Rev. Sci. 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Electron Devices"}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/26\/14\/4432\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T08:59:44Z","timestamp":1783933184000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/26\/14\/4432"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,13]]},"references-count":47,"journal-issue":{"issue":"14","published-online":{"date-parts":[[2026,7]]}},"alternative-id":["s26144432"],"URL":"https:\/\/doi.org\/10.3390\/s26144432","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,13]]}}}