{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:06:16Z","timestamp":1772118376652,"version":"3.50.1"},"reference-count":59,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Applied Sciences"],"abstract":"<jats:p>Multiferroic systems are of great interest for technological applications. To improve the fabrication of thin films, stereometric and fractal analysis of surface morphology have been extensively performed to understand the influence of physical parameters on the quality of spatial patterns. In this work, GaMnO3 was synthesized and thin films were deposited on Pt(111)\/TiO2\/SiO2\/Si substrates using a spin coating apparatus to study the correlation between their stereometric and fractal parameters. All films were studied by X-ray diffraction (XRD), where the structure and microstructure of the film sintered at 850 \u00b0C was investigated by Rietveld refinement. Topographic maps of the films were obtained using an atomic force microscope (AFM) in tapping mode. The results show that the film sintered at 850 \u00b0C exhibited a clear formation of a GdMnO3 orthorhombic structure with crystallite size of ~14 nm and a microstrain higher than other values reported in the literature. Its surface morphology presented a rougher topography, which was confirmed by the height parameters. Topographic differences due to different asymmetries and shapes of the height distributions between the films were observed. Specific stereometric parameters also showed differences in the morphology and microtexture of the films. Qualitative rendering obtained by commercial image processing software revealed substantial differences between the microtextures of the films. Fractal and advanced fractal parameters showed that the film sintered at 850 \u00b0C had greater spatial complexity, which was due to their higher topographic roughness, lower surface percolation and greater topographic uniformity, being dominated by low dominant special frequencies. Our combination of stereometric and fractal measurements can be useful to improve the fabrication process by optimizing spatial patterns as a function of the sintering temperature of the film.<\/jats:p>","DOI":"10.3390\/app11093886","type":"journal-article","created":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T22:31:39Z","timestamp":1619389899000},"page":"3886","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":18,"title":["Fractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO3 Thin Films Deposited by Spin Coating"],"prefix":"10.3390","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8091-1212","authenticated-orcid":false,"given":"Yonny","family":"Romaguera-Barcelay","sequence":"first","affiliation":[{"name":"Laboratory of Nanomaterials Synthesis and Nanoscopy, Physics Department, Federal University of Amazonas, Amazonas 69067-005, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1311-7657","authenticated-orcid":false,"given":"\u015etefan","family":"\u0162\u0103lu","sequence":"additional","affiliation":[{"name":"The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, 15 Constantin Daicoviciu St., 400020 Cluj-Napoca, Romania"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1219-8646","authenticated-orcid":false,"given":"Robert Saraiva","family":"Matos","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering, Federal University of Sergipe, S\u00e3o Crist\u00f3v\u00e3o, Sergipe 49100-000, Brazil"}]},{"given":"Rosane Maria Pessoa Bet\u00e2nio","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering, Federal University of Sergipe, S\u00e3o Crist\u00f3v\u00e3o, Sergipe 49100-000, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4659-7503","authenticated-orcid":false,"given":"Joaquim Agostinho","family":"Moreira","sequence":"additional","affiliation":[{"name":"IFIMUP and Departamento de F\u00edsica e Astronomia da Universidade do Porto, Rua do Campo Alegre s\/n, 4169-007 Porto, Portugal"}]},{"given":"Javier Perez","family":"de Cruz","sequence":"additional","affiliation":[{"name":"Instituto de Soldadura e Qualidade, Av. Prof. Dr. Cavaco Silva, 2740-120 Porto Salvo, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9811-6391","authenticated-orcid":false,"given":"Henrique Duarte","family":"da Fonseca Filho","sequence":"additional","affiliation":[{"name":"Laboratory of Nanomaterials Synthesis and Nanoscopy, Physics Department, Federal University of Amazonas, Amazonas 69067-005, Brazil"}]}],"member":"1968","published-online":{"date-parts":[[2021,4,25]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"367","DOI":"10.1038\/nmat3861","article-title":"Room-temperature antiferromagnetic memory resistor","volume":"13","author":"Marti","year":"2014","journal-title":"Nat. Mater."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"425","DOI":"10.1038\/nmat2189","article-title":"Towards a magnetoelectric memory","volume":"7","author":"Bibes","year":"2008","journal-title":"Nat. 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