{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T15:37:33Z","timestamp":1773329853398,"version":"3.50.1"},"reference-count":27,"publisher":"MDPI AG","issue":"14","license":[{"start":{"date-parts":[[2024,7,16]],"date-time":"2024-07-16T00:00:00Z","timestamp":1721088000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"European Structural and Investment Funds in the FEDER component","award":["SIFN-01-9999-FN-179491"],"award-info":[{"award-number":["SIFN-01-9999-FN-179491"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Electronics"],"abstract":"<jats:p>Simulation-based Fault Injection (FI) is crucial for validating system behaviour in safety-critical applications, such as the automotive industry. The ISO 26262 standard\u2019s Part 11 extension provides failure modes for digital components, driving the development of new fault models to assess software-implemented mechanisms against random hardware failures (RHF). This paper proposes a Fault Injection framework, QEFIRA, and shows its ability to achieve the failure modes proposed by Part 11 of the ISO 26262 standard and estimate relevant metrics for safety mechanisms. QEFIRA uses QEMU to inject permanent and transient faults during runtime, whilst logging the system state and providing automatic post-execution analysis. Complemented with a confusion matrix, it allows us to gather standard compliant metrics to characterise and evaluate different designs in the early stages of development. Comparatively to the native QEMU implementation, the tool only shows a slowdown of 1.4\u00d7 for real-time microcontroller-based applications.<\/jats:p>","DOI":"10.3390\/electronics13142787","type":"journal-article","created":{"date-parts":[[2024,7,16]],"date-time":"2024-07-16T11:12:49Z","timestamp":1721128369000},"page":"2787","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Virtualized Fault Injection Framework for ISO 26262-Compliant Digital Component Hardware Faults"],"prefix":"10.3390","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0334-4784","authenticated-orcid":false,"given":"Rui","family":"Almeida","sequence":"first","affiliation":[{"name":"Department of Industrial Electronics, Centro Algoritmi, University of Minho, 4800-058 Guimar\u00e3es, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9006-6139","authenticated-orcid":false,"given":"Vitor","family":"Silva","sequence":"additional","affiliation":[{"name":"Department of Industrial Electronics, Centro Algoritmi, University of Minho, 4800-058 Guimar\u00e3es, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9954-9746","authenticated-orcid":false,"given":"Jorge","family":"Cabral","sequence":"additional","affiliation":[{"name":"Department of Industrial Electronics, Centro Algoritmi, University of Minho, 4800-058 Guimar\u00e3es, Portugal"}]}],"member":"1968","published-online":{"date-parts":[[2024,7,16]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/MM.2005.110","article-title":"Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation","volume":"5","author":"Borkar","year":"2005","journal-title":"IEEE Micro"},{"key":"ref_2","unstructured":"(2018). 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