{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T13:02:56Z","timestamp":1767790976595,"version":"3.49.0"},"reference-count":0,"publisher":"Politechnika Wroclawska Oficyna Wydawnicza","issue":"1","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["EISEJ"],"published-print":{"date-parts":[[2026]]},"abstract":"<jats:p>Context: Artificial Intelligence (AI) is increasingly integrated into critical domains, making defect analysis essential to ensure system quality and reliability. Current defect classification frameworks do not adequately address the unique properties of AI systems.<\/jats:p>\n                  <jats:p>Objective: This paper proposes AIODC, a defect classification framework inspired by the Orthogonal Defect Classification (ODC) that incorporates AI-specific characteristics. Method: The framework extends ODC by introducing three new attributes \u2013 Data, Learning, and Thinking \u2013 and adds a \u201cCatastrophic\u201d severity level to account for risks associated with AI. Additionally, it modifies impact mapping utilizing AI\/AIP quality models. The methodology was validated through a case study that examined 42 actual Keras defects.<\/jats:p>\n                  <jats:p>Results: This study demonstrated the feasibility of modifying ODC for AI systems to classify its defects. The case study indicated that defects occurring during the Learning phase are the most prevalent and were significantly linked to high severity, whereas defects in the Thinking phase primarily impact trustworthiness and accuracy.<\/jats:p>\n                  <jats:p>Conclusions: The results affirm the practicality and significance of AIODC in identifying high-risk defect categories, thus facilitating more focused and effective quality assurance strategies in AI-driven software systems.<\/jats:p>","DOI":"10.37190\/e-inf260102","type":"journal-article","created":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T07:26:47Z","timestamp":1765783607000},"page":"260102","source":"Crossref","is-referenced-by-count":0,"title":["A Defect Classification Framework for AI-Based Software Systems (AIODC)"],"prefix":"10.37190","volume":"20","author":[{"given":"Mohammed","family":"Alannsary","sequence":"first","affiliation":[]}],"member":"23140","published-online":{"date-parts":[[2026]]},"container-title":["e-Informatica Software Engineering Journal"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.e-informatyka.pl\/EISEJ\/papers\/2026\/1\/2\/eInformatica2026Art02.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:27:46Z","timestamp":1767774466000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.e-informatyka.pl\/EISEJ\/papers\/2026\/1\/2\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":0,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2026]]},"published-print":{"date-parts":[[2026]]}},"URL":"https:\/\/doi.org\/10.37190\/e-inf260102","relation":{},"ISSN":["2084-4840"],"issn-type":[{"value":"2084-4840","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}