{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T23:54:00Z","timestamp":1790898840717,"version":"4.1.0"},"reference-count":0,"publisher":"MyJove Corporation","issue":"236","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["JoVE"],"DOI":"10.3791\/70455","type":"journal-article","created":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T23:00:20Z","timestamp":1790895620000},"source":"Crossref","is-referenced-by-count":0,"title":["Cryogenic Scanning Electron Nanobeam Diffraction Workflows for Structural Characterization of Beam-Sensitive Battery Interfaces"],"prefix":"10.3791","author":[{"given":"Hyeongjun","family":"Koh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Eric A.","family":"Stach","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"2098","published-online":{"date-parts":[[2026,10,1]]},"container-title":["Journal of Visualized Experiments"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jove.com\/t\/70455\/cryogenic-scanning-electron-nanobeam-diffraction-workflows-for","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T23:00:21Z","timestamp":1790895621000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jove.com\/t\/70455\/cryogenic-scanning-electron-nanobeam-diffraction-workflows-for"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,10,1]]},"references-count":0,"journal-issue":{"issue":"236","published-online":{"date-parts":[[2026]]}},"URL":"https:\/\/doi.org\/10.3791\/70455","relation":{},"ISSN":["1940-087X"],"issn-type":[{"value":"1940-087X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,10,1]]}}}