{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T16:35:12Z","timestamp":1781109312662,"version":"3.54.1"},"reference-count":29,"publisher":"IGI Global Scientific Publishing","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4,1]]},"abstract":"<p>This article reports the results of an industrial case study demonstrating the efficacy of a model-based testing process in assuring the quality of highly configurable systems from the automation domain. Escalating demand for flexibility has made modern embedded software systems highly configurable. This configurability is often realized through parameters and a highly configurable system possesses a handful of those. Small changes in parameter values can account for significant changes in the system\u2019s behavior, whereas in other cases, changed parameters may not result in any perceivable reaction. This case study addresses the challenge of applying model-based testing to configurable embedded software systems to reduce development effort. As a result of the case study, a model-based testing process was developed and tailored toward the needs of the automation domain. This process integrates existing model-based testing methods and tools, such as combinatorial design and constraint processing. The testing process was applied as part of the case study and analyzed in terms of its actual saving potentials, which reduced the testing effort by more than a third.<\/p>","DOI":"10.4018\/jertcs.2011040102","type":"journal-article","created":{"date-parts":[[2011,10,19]],"date-time":"2011-10-19T12:18:53Z","timestamp":1319026733000},"page":"22-41","source":"Crossref","is-referenced-by-count":0,"title":["Model-Based Testing of Highly Configurable Embedded Systems in the Automation Domain"],"prefix":"10.4018","volume":"2","author":[{"given":"Detlef","family":"Streitferdt","sequence":"first","affiliation":[{"name":"Ilmenau University of Technology, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Florian","family":"Kantz","sequence":"additional","affiliation":[{"name":"ABB Corporate Research, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Philipp","family":"Nenninger","sequence":"additional","affiliation":[{"name":"ABB Corporate Research, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Thomas","family":"Ruschival","sequence":"additional","affiliation":[{"name":"ABB Corporate Research, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Holger","family":"Kaul","sequence":"additional","affiliation":[{"name":"ABB Corporate Research, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Thomas","family":"Bauer","sequence":"additional","affiliation":[{"name":"Fraunhofer IESE, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tanvir","family":"Hussain","sequence":"additional","affiliation":[{"name":"Fraunhofer IESE, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Robert","family":"Eschbach","sequence":"additional","affiliation":[{"name":"Fraunhofer IESE, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"2432","reference":[{"key":"jertcs.2011040102-0","article-title":"The goal question metric approach","author":"V. R.Basili","year":"1994","journal-title":"Encyclopedia of software engineering"},{"key":"jertcs.2011040102-1","doi-asserted-by":"crossref","unstructured":"Bauer, T., B\u00f6hr, F., Landmann, D., Beletski, T., Eschbach, R., & Poore, J. H. (2007). From requirements to statistical testing of embedded systems. In Proceedings of the Software Engineering for Automotive Systems Workshops, Minneapolis, MN.","DOI":"10.1109\/SEAS.2007.5"},{"key":"jertcs.2011040102-2","unstructured":"Bauer, T., Eschbach, R., Groessl, M., Hussain, T., Streitferdt, D., & Kantz, F. (2009). Combining combinatorial and model-based test approaches for highly configurable safety-critical systems. In Proceedings of the 2nd Workshop on Model-based Testing in Practice at the 5th European Conference on Model-Driven Architecture Foundations and Applications, Enschede, The Netherlands."},{"key":"jertcs.2011040102-3","unstructured":"Bauer, T., Stallbaum, H., Metzger, A., & Eschbach, R. (2008). Risikobasierte Ableitung und Priorisierung von Testf\u00e4llen f\u00fcr den modellbasierten Systemtest. In Proceedings of the Software Engineering Conference, Munich, Germany."},{"key":"jertcs.2011040102-4","doi-asserted-by":"crossref","unstructured":"Cohen, M. B., Dwyer, M. B., & Shi, J. (2006). Coverage and adequacy in software product line testing. In Proceedings of the ISSTA Workshop on Role of Software Architecture for Testing and Analysis (pp. 53-63).","DOI":"10.1145\/1147249.1147257"},{"key":"jertcs.2011040102-5","author":"J.Davies","year":"1996","journal-title":"Using Z: Specification, refinement and proof"},{"key":"jertcs.2011040102-6","author":"A.Gill","year":"1962","journal-title":"Introduction to the theory of finite-state machines"},{"key":"jertcs.2011040102-7","unstructured":"Harel, D., & Thiagarajan, P. S. (2003). Message sequence charts. Retrieved from http:\/\/www.comp.nus.edu.sg\/~thiagu\/public_papers\/surveymsc.pdf"},{"key":"jertcs.2011040102-8","author":"C. A. R.Hoare","year":"1985","journal-title":"Communicating sequential processes"},{"key":"jertcs.2011040102-9","doi-asserted-by":"crossref","unstructured":"Kamsties, E., Reuys, A., Pohl, K., & Reis, S. (2004). Testing variabilities in use case models. In F. van der Linden (Ed.), Proceedings of the 5th International Workshop on Software Product-Family Engineering (LNCS 3014, pp.6-18).","DOI":"10.1007\/978-3-540-24667-1_2"},{"key":"jertcs.2011040102-10","doi-asserted-by":"crossref","unstructured":"Kantz, F., Ruschival, T., Nenninger, P., & Streitferdt, D. (2009). Testing with large parameter sets for the development of embedded systems in the automation domain. In Proceedings of the 2nd International Workshop on Component-Based Design of Resource-Constrained Systems at the 33rd Annual IEEE International Computers, Software and Applications Conference, Seattle, WA (pp. 504-509).","DOI":"10.1109\/COMPSAC.2009.183"},{"key":"jertcs.2011040102-11","doi-asserted-by":"crossref","unstructured":"Kloos, J., & Eschbach, R. (2009). Generating system models for a highly configurable train control system using a domain-specific language: A case study. In Proceedings of the 5th Workshop on Advances in Model Based Testing, Denver, CO.","DOI":"10.1109\/ICSTW.2009.32"},{"key":"jertcs.2011040102-12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2004.24"},{"key":"jertcs.2011040102-13","doi-asserted-by":"crossref","unstructured":"McGregor, J. D. (2001). Testing a software product line (Tech. Rep. CMU\/SEI-2001-TR-022). Pittsburgh, USA, Carnegie Mellon University","DOI":"10.21236\/ADA401736"},{"key":"jertcs.2011040102-14","doi-asserted-by":"publisher","DOI":"10.1109\/32.120314"},{"key":"jertcs.2011040102-15","doi-asserted-by":"publisher","DOI":"10.1109\/52.199724"},{"key":"jertcs.2011040102-16","unstructured":"Object Management Group (OMG). (2000). Object constraint language specification: OMG unified modeling language specification, version 1.3. Retrieved from http:\/\/www.omg.org\/spec\/UML\/1.3"},{"key":"jertcs.2011040102-17","doi-asserted-by":"crossref","unstructured":"Olimpiew, E. M., & Gomaa, H. (2005). Model-based testing for applications derived from software product lines. In Proceedings of the 1st International Workshop on Advances in Model-Based Testing (pp. 1-7).","DOI":"10.1145\/1082983.1083279"},{"key":"jertcs.2011040102-18","author":"J. L.Peterson","year":"1981","journal-title":"Petri net theory and the modeling of systems"},{"key":"jertcs.2011040102-19","doi-asserted-by":"crossref","unstructured":"Prowell, S. (2005). Using Markov chain usage models to test complex systems. In Proceedings of the 38th Annual Hawaii International Conference on System Sciences (p. 318).","DOI":"10.1109\/HICSS.2005.663"},{"key":"jertcs.2011040102-20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1199071"},{"key":"jertcs.2011040102-21","author":"S.Prowell","year":"1999","journal-title":"Cleanroom software engineering: Technology and process"},{"key":"jertcs.2011040102-22","author":"M.Reinhold","year":"2003","journal-title":"Praxistauglichkeit von Vorgehensmodellen: Specification of large IT-systems \u2013 integration of requirements engineering and UML based on V-Model\u201997"},{"key":"jertcs.2011040102-23","doi-asserted-by":"crossref","unstructured":"Reuys, A., Kamsties, E., Pohl, K., & Reis, S. (2005). Model-based system testing of software product families. In O. Pastor & J. Falc\u00e3o e Cunha (Eds.), Proceedings of the 17th International Conference on Advanced Information Systems Engineering (LNCS 3520, pp. 519-534).","DOI":"10.1007\/11431855_36"},{"key":"jertcs.2011040102-24","doi-asserted-by":"crossref","unstructured":"Ruschival, T., Nenninger, P., Kantz, F., & Streitferdt, D. (2009). Test case mutation in hybrid state space for reduction of no-fault-found test results in the industrial automation domain. In Proceedings of the 2nd International Workshop on Industrial Experience in Embedded Systems Design at the 33rd Annual IEEE International Computers, Software and Applications Conference, Seattle, WA (pp. 528-533).","DOI":"10.1109\/COMPSAC.2009.187"},{"key":"jertcs.2011040102-25","author":"M.Utting","year":"2006","journal-title":"Practical model-based testing: A tools approach"},{"key":"jertcs.2011040102-26","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-60566-750-8.ch015"},{"key":"jertcs.2011040102-27","unstructured":"Zimmermann, F., Eschbach, R., Kloos, J., & Bauer, T. (2009). Risiko-basiertes statistisches Testen. [TAV group Meeting of the Gesellschaft f\u00fcr Informatik]. Retrieved from http:\/\/pi.informatik.uni-siegen.de\/stt\/29_4\/01_Fachgruppenberichte\/TAV28P6Zimmermann.pdf"},{"key":"jertcs.2011040102-28","unstructured":"Zimmermann, F., Kloos, J., Eschbach, R., & Bauer, T. (2009). Risk-based statistical testing: A refinement-based approach to the reliability analysis of safety-critical systems. In Proceedings of the European Workshop on Dependable Systems, Toulouse, France."}],"container-title":["International Journal of Embedded and Real-Time Communication Systems"],"original-title":[],"language":"ng","link":[{"URL":"https:\/\/www.igi-global.com\/viewtitle.aspx?TitleId=54247","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T15:59:52Z","timestamp":1654099192000},"score":1,"resource":{"primary":{"URL":"https:\/\/services.igi-global.com\/resolvedoi\/resolve.aspx?doi=10.4018\/jertcs.2011040102"}},"subtitle":[""],"short-title":[],"issued":{"date-parts":[[2011,4,1]]},"references-count":29,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2011,4]]}},"URL":"https:\/\/doi.org\/10.4018\/jertcs.2011040102","relation":{},"ISSN":["1947-3176","1947-3184"],"issn-type":[{"value":"1947-3176","type":"print"},{"value":"1947-3184","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,4,1]]}}}