{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T01:28:56Z","timestamp":1648690136953},"reference-count":5,"publisher":"International Academy Publishing (IAP)","issue":"7","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["JCP"],"DOI":"10.4304\/jcp.6.7.1297-1301","type":"journal-article","created":{"date-parts":[[2011,7,19]],"date-time":"2011-07-19T10:39:15Z","timestamp":1311071955000},"source":"Crossref","is-referenced-by-count":1,"title":["A New Test Data Compression Scheme"],"prefix":"10.17706","volume":"6","author":[{"given":"Ling","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jishun","family":"Kuang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"7163","published-online":{"date-parts":[[2011,7,1]]},"reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.56"},{"issue":"1","key":"ref2","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1145\/1044111.1044117","article-title":"Tehranipour. M, \u00e2\u0080\u009cRL-Huffman encoding for test compression and power reduction in scan applicaiton\u00e2\u0080\u009d","volume":"10","year":"2005","journal-title":"ACM Trans. Des. Autom. Electron. Syst.","ISSN":"http:\/\/id.crossref.org\/issn\/1084-4309","issn-type":"print"},{"key":"ref3","first-page":"1290","volume-title":"Igor. Alekejev, J. Raik, etc, \u00e2\u0080\u009cReseeding using Compaction of Pre-Generated LFSR Sub-Sequences\u00e2","author":"Jutman","year":"2008"},{"key":"ref4","first-page":"53","article-title":"AL-SUWAIYAN A.: \u00e2\u0080\u0098An effcient test relaxationtechnique for combinational and full-scan sequentialcircuits\u00e2\u0080\u0099. VTS \u00e2\u0080\u009802","volume-title":"Proc. 20th IEEE VLSI Test Symp.","year":"2002"},{"key":"ref5","first-page":"283","article-title":"\u00e2\u0080\u009cTest set compaction algorithms for combinational circuits,\u00e2\u0080\u009d in Proc. Int","volume-title":"Conf. Computer-Aided Design","author":"Hamzaoglu","year":"1998"}],"container-title":["Journal of Computers"],"original-title":[],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T23:21:43Z","timestamp":1497914503000},"score":1,"resource":{"primary":{"URL":"http:\/\/ojs.academypublisher.com\/index.php\/jcp\/article\/view\/5339"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7,1]]},"references-count":5,"journal-issue":{"issue":"7","published-online":{"date-parts":[[2011,7,1]]}},"URL":"https:\/\/doi.org\/10.4304\/jcp.6.7.1297-1301","relation":{},"ISSN":["1796-203X"],"issn-type":[{"value":"1796-203X","type":"print"}],"subject":[],"published":{"date-parts":[[2011,7,1]]}}}