{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T18:39:17Z","timestamp":1761676757600},"reference-count":0,"publisher":"SCITEPRESS - Science and Technology Publications","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.5220\/0007306602340240","type":"proceedings-article","created":{"date-parts":[[2019,3,15]],"date-time":"2019-03-15T11:03:30Z","timestamp":1552647810000},"page":"234-240","source":"Crossref","is-referenced-by-count":5,"title":["Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification"],"prefix":"10.5220","author":[{"given":"Du-Ming","family":"Tsai","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Chung-Li, Taiwan and Republic of China, --- Select a Country ---"}]},{"given":"Morris","family":"Fan","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, National Taipei University of Technology, 1 Sec. 3 Zhongxiao E. Rd., Taipei, Taiwan and Republic of China, --- Select a Country ---"}]},{"given":"Yi-Quan","family":"Huang","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Chung-Li, Taiwan and Republic of China, --- Select a Country ---"}]},{"given":"Wei-Yao","family":"Chiu","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Chung-Li, Taiwan and Republic of China, --- Select a Country ---"}]}],"member":"3171","event":{"name":"14th International Conference on Computer Vision Theory and Applications","start":{"date-parts":[[2019,2,25]]},"location":"Prague, Czech Republic","end":{"date-parts":[[2019,2,27]]}},"container-title":["Proceedings of the 14th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications"],"original-title":["Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification"],"deposited":{"date-parts":[[2019,5,15]],"date-time":"2019-05-15T13:20:46Z","timestamp":1557926446000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.scitepress.org\/DigitalLibrary\/Link.aspx?doi=10.5220\/0007306602340240"}},"subtitle":[""],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":0,"URL":"https:\/\/doi.org\/10.5220\/0007306602340240","relation":{},"subject":[],"published":{"date-parts":[[2019]]}}}