{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:03:34Z","timestamp":1725591814057},"reference-count":0,"publisher":"SCITEPRESS - Science and Technology Publications","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.5220\/0011316900003277","type":"proceedings-article","created":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T16:19:02Z","timestamp":1657815542000},"page":"193-198","source":"Crossref","is-referenced-by-count":0,"title":["Automatic UML Defects Detection based on Image of Diagram"],"prefix":"10.5220","author":[{"given":"Murielle","family":"Lokonon","sequence":"first","affiliation":[{"name":"Ecole Polytechnique d\u2019Abomey Calavi (EPAC), University of Abomey Calavi (UAC), Abomey-calavi, Benin, --- Select a Country ---"}]},{"given":"Vinasetan","family":"Houndji","sequence":"additional","affiliation":[{"name":"Institut de Formation et de Recherche en Informatique (IFRI), University of Abomey Calavi (UAC), Abomey-calavi, Benin, --- Select a Country ---"}]}],"member":"3171","event":{"name":"3rd International Conference on Deep Learning Theory and Applications","start":{"date-parts":[[2022,7,12]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2022,7,14]]}},"container-title":["Proceedings of the 3rd International Conference on Deep Learning Theory and Applications"],"original-title":["Automatic UML Defects Detection based on Image of Diagram"],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T16:19:13Z","timestamp":1657815553000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.scitepress.org\/DigitalLibrary\/Link.aspx?doi=10.5220\/0011316900003277"}},"subtitle":[""],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":0,"URL":"https:\/\/doi.org\/10.5220\/0011316900003277","relation":{},"subject":[],"published":{"date-parts":[[2022]]}}}