{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,12]],"date-time":"2024-10-12T04:12:00Z","timestamp":1728706320929},"reference-count":0,"publisher":"National Institute of Standards and Technology (NIST)","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J. RES. NATL. INST. STAN."],"DOI":"10.6028\/jres.119.021","type":"journal-article","created":{"date-parts":[[2014,12,1]],"date-time":"2014-12-01T13:54:29Z","timestamp":1417442069000},"page":"540","source":"Crossref","is-referenced-by-count":2,"title":["The Metrology of a Rastered Spot of X Rays used in Security Screening"],"prefix":"10.6028","volume":"119","author":[{"given":"Lawrence T.","family":"Hudson","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jack L.","family":"Glover","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronaldo","family":"Minniti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"4068","published-online":{"date-parts":[[2014,12]]},"container-title":["Journal of Research of the National Institute of Standards and Technology"],"original-title":[],"language":"en","deposited":{"date-parts":[[2024,10,11]],"date-time":"2024-10-11T18:28:58Z","timestamp":1728671338000},"score":1,"resource":{"primary":{"URL":"https:\/\/nvlpubs.nist.gov\/nistpubs\/jres\/119\/jres.119.021.pdf"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":0,"URL":"https:\/\/doi.org\/10.6028\/jres.119.021","relation":{},"ISSN":["2165-7254"],"issn-type":[{"type":"electronic","value":"2165-7254"}],"subject":[],"published":{"date-parts":[[2014,12]]}}}