{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"institution":[{"name":"National Bureau of Standards","acronym":["NBS"],"place":["Gaithersburg, MD"]}],"indexed":{"date-parts":[[2024,10,12]],"date-time":"2024-10-12T04:15:13Z","timestamp":1728706513371},"publisher-location":"Gaithersburg, MD","reference-count":0,"publisher":"National Bureau of Standards","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.6028\/nbs.tn.256","type":"report","created":{"date-parts":[[2013,9,13]],"date-time":"2013-09-13T13:37:44Z","timestamp":1379079464000},"source":"Crossref","is-referenced-by-count":2,"title":["Microwave reflection techniques for dense plasma diagnostics"],"prefix":"10.6028","author":[{"given":"S","family":"Takeda","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"4068","published-online":{"date-parts":[[1965]]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2024,10,11]],"date-time":"2024-10-11T19:19:42Z","timestamp":1728674382000},"score":1,"resource":{"primary":{"URL":"https:\/\/nvlpubs.nist.gov\/nistpubs\/Legacy\/TN\/nbstechnicalnote256.pdf"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1965]]},"references-count":0,"URL":"https:\/\/doi.org\/10.6028\/nbs.tn.256","relation":{},"subject":[],"published":{"date-parts":[[1965]]}}}