{"status":"ok","message-type":"work-list","message-version":"1.0.0","message":{"facets":{},"total-results":17053417,"items":[{"indexed":{"date-parts":[[2025,1,30]],"date-time":"2025-01-30T05:38:25Z","timestamp":1738215505652,"version":"3.34.0"},"reference-count":0,"publisher":"\u041e\u041e\u041e \u00abGEOTAR-Media\u00bb Publishing Group","isbn-type":[{"value":"9785970488843","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[2025]]},"DOI":"10.33029\/9704-8884-3-dms-2025-1-168","type":"book-chapter","created":{"date-parts":[[2025,1,29]],"date-time":"2025-01-29T07:37:04Z","timestamp":1738136224000},"page":"1-168","source":"Crossref","is-referenced-by-count":0,"title":["Dental materials science"],"prefix":"10.33029","member":"18453","published-online":{"date-parts":[[2025]]},"container-title":["Dental materials science"],"original-title":["Dental materials science"],"deposited":{"date-parts":[[2025,1,29]],"date-time":"2025-01-29T07:37:05Z","timestamp":1738136225000},"score":11.437878,"resource":{"primary":{"URL":"https:\/\/www.rosmedlib.ru\/book\/ISBN9785970488843.html"}},"editor":[{"given":"S.N. .","family":"Razumova","sequence":"first","affiliation":[]}],"issued":{"date-parts":[[2025]]},"ISBN":["9785970488843"],"references-count":0,"URL":"https:\/\/doi.org\/10.33029\/9704-8884-3-dms-2025-1-168","published":{"date-parts":[[2025]]}},{"indexed":{"date-parts":[[2022,6,13]],"date-time":"2022-06-13T01:10:46Z","timestamp":1655082646382},"edition-number":"1","reference-count":0,"publisher":"Cambridge University Press","license":[{"start":{"date-parts":[[2014,8,5]],"date-time":"2014-08-05T00:00:00Z","timestamp":1407196800000},"content-version":"unspecified","delay-in-days":5,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[2014,7,31]]},"DOI":"10.1017\/cbo9780511862397.002","type":"book-chapter","created":{"date-parts":[[2014,8,6]],"date-time":"2014-08-06T05:01:20Z","timestamp":1407301280000},"page":"1-16","source":"Crossref","is-referenced-by-count":0,"title":["Evolution of materials science and engineering: from natural to bioinspired materials"],"prefix":"10.1017","member":"56","container-title":["Biological Materials Science"],"link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/80A9C5F0B502CC1116544913D841FD8B","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,13]],"date-time":"2022-06-13T00:57:19Z","timestamp":1655081839000},"score":10.939293,"resource":{"primary":{"URL":"https:\/\/www.cambridge.org\/core\/product\/identifier\/CBO9780511862397A006\/type\/book_part"}},"issued":{"date-parts":[[2014,7,31]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1017\/cbo9780511862397.002","published":{"date-parts":[[2014,7,31]]}},{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T12:13:25Z","timestamp":1648642405074},"reference-count":0,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[1961,1,1]],"date-time":"1961-01-01T00:00:00Z","timestamp":-283996800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Progress in Materials Science"],"published-print":{"date-parts":[[1961,1]]},"DOI":"10.1016\/0079-6425(61)90007-x","type":"journal-article","created":{"date-parts":[[2003,6,21]],"date-time":"2003-06-21T12:36:58Z","timestamp":1056199018000},"page":"i","source":"Crossref","is-referenced-by-count":2,"title":["Progress in materials science"],"prefix":"10.1016","volume":"9","member":"78","container-title":["Progress in Materials Science"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:007964256190007X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:007964256190007X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T01:52:21Z","timestamp":1552960341000},"score":10.931435,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/007964256190007X"}},"issued":{"date-parts":[[1961,1]]},"references-count":0,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1961,1]]}},"alternative-id":["007964256190007X"],"URL":"https:\/\/doi.org\/10.1016\/0079-6425(61)90007-x","ISSN":["0079-6425"],"issn-type":[{"value":"0079-6425","type":"print"}],"published":{"date-parts":[[1961,1]]}},{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T04:03:46Z","timestamp":1648699426191},"reference-count":0,"publisher":"Hindawi Limited","content-domain":{"domain":[],"crossmark-restriction":false},"DOI":"10.5402\/ms","type":"journal","created":{"date-parts":[[2012,10,25]],"date-time":"2012-10-25T12:27:05Z","timestamp":1351168025000},"source":"Crossref","is-referenced-by-count":0,"title":["ISRN Materials Science"],"prefix":"10.5402","member":"98","language":"en","deposited":{"date-parts":[[2012,10,25]],"date-time":"2012-10-25T12:27:05Z","timestamp":1351168025000},"score":10.924513,"resource":{"primary":{"URL":"http:\/\/www.hindawi.com\/isrn\/ms\/"}},"short-title":["ISRN Materials Science"],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.5402\/ms","ISSN":["2090-6099"],"issn-type":[{"value":"2090-6099","type":"electronic"}]},{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T13:49:46Z","timestamp":1648993786504},"reference-count":0,"publisher":"Hindawi Limited","content-domain":{"domain":[],"crossmark-restriction":false},"DOI":"10.1155\/4826","type":"journal","created":{"date-parts":[[2017,12,10]],"date-time":"2017-12-10T06:53:27Z","timestamp":1512888807000},"source":"Crossref","is-referenced-by-count":0,"title":["ISRN Materials Science"],"prefix":"10.1155","member":"98","language":"en","deposited":{"date-parts":[[2017,12,10]],"date-time":"2017-12-10T06:53:27Z","timestamp":1512888807000},"score":10.92,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/archive\/"}},"short-title":["ISRN Materials Science"],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1155\/4826","ISSN":["2090-6099"],"issn-type":[{"value":"2090-6099","type":"electronic"}]},{"indexed":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T11:40:11Z","timestamp":1750765211362,"version":"3.41.0"},"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"4-6","license":[{"start":{"date-parts":[[2001,6,1]],"date-time":"2001-06-01T00:00:00Z","timestamp":991353600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2001,6,1]],"date-time":"2001-06-01T00:00:00Z","timestamp":991353600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Materials Science: Materials in Electronics"],"published-print":{"date-parts":[[2001,6]]},"DOI":"10.1023\/a:1011230821605","type":"journal-article","created":{"date-parts":[[2002,12,23]],"date-time":"2002-12-23T09:18:21Z","timestamp":1040635101000},"page":"5-5","source":"Crossref","is-referenced-by-count":0,"title":["Editorial for Journal of Materials Science: Materials in Electronics"],"prefix":"10.1007","volume":"12","author":[{"given":"Arthur","family":"Willoughby","sequence":"first","affiliation":[]}],"member":"297","container-title":["Journal of Materials Science: Materials in Electronics"],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011230821605.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1011230821605\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011230821605.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T11:10:49Z","timestamp":1750763449000},"score":10.852732,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1011230821605"}},"issued":{"date-parts":[[2001,6]]},"references-count":0,"journal-issue":{"issue":"4-6","published-print":{"date-parts":[[2001,6]]}},"alternative-id":["351489"],"URL":"https:\/\/doi.org\/10.1023\/a:1011230821605","ISSN":["0957-4522","1573-482X"],"issn-type":[{"type":"print","value":"0957-4522"},{"type":"electronic","value":"1573-482X"}],"published":{"date-parts":[[2001,6]]}},{"indexed":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T04:06:40Z","timestamp":1750997200634,"version":"3.41.0"},"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2003,3,1]],"date-time":"2003-03-01T00:00:00Z","timestamp":1046476800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2003,3,1]],"date-time":"2003-03-01T00:00:00Z","timestamp":1046476800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Materials Science: Materials in Medicine"],"published-print":{"date-parts":[[2003,3]]},"DOI":"10.1023\/a:1022805428602","type":"journal-article","created":{"date-parts":[[2003,4,4]],"date-time":"2003-04-04T21:57:10Z","timestamp":1049493430000},"page":"289-289","source":"Crossref","is-referenced-by-count":4,"title":["Review papers in Journal of Materials Science"],"prefix":"10.1007","volume":"14","member":"297","container-title":["Journal of Materials Science: Materials in Medicine"],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1022805428602.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1022805428602\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1022805428602.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,26]],"date-time":"2025-06-26T12:42:52Z","timestamp":1750941772000},"score":10.851728,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1022805428602"}},"issued":{"date-parts":[[2003,3]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2003,3]]}},"alternative-id":["5119207"],"URL":"https:\/\/doi.org\/10.1023\/a:1022805428602","ISSN":["0957-4530","1573-4838"],"issn-type":[{"type":"print","value":"0957-4530"},{"type":"electronic","value":"1573-4838"}],"published":{"date-parts":[[2003,3]]}},{"indexed":{"date-parts":[[2024,7,10]],"date-time":"2024-07-10T14:29:05Z","timestamp":1720621745455},"reference-count":0,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[1987,12,1]],"date-time":"1987-12-01T00:00:00Z","timestamp":565315200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering"],"published-print":{"date-parts":[[1987,12]]},"DOI":"10.1016\/0025-5416(87)90569-6","type":"journal-article","created":{"date-parts":[[2003,6,21]],"date-time":"2003-06-21T00:23:30Z","timestamp":1056155010000},"page":"326","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["Advances in materials characterization, II, materials science research vol. 19"],"prefix":"10.1016","volume":"96","author":[{"given":"Michael","family":"Dudley","sequence":"first","affiliation":[]}],"member":"78","container-title":["Materials Science and Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0025541687905696?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0025541687905696?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T16:20:42Z","timestamp":1553012442000},"score":10.811697,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0025541687905696"}},"issued":{"date-parts":[[1987,12]]},"references-count":0,"alternative-id":["0025541687905696"],"URL":"https:\/\/doi.org\/10.1016\/0025-5416(87)90569-6","ISSN":["0025-5416"],"issn-type":[{"value":"0025-5416","type":"print"}],"published":{"date-parts":[[1987,12]]}},{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T23:50:25Z","timestamp":1648597825057},"reference-count":0,"publisher":"Elsevier BV","issue":"4","license":[{"start":{"date-parts":[[1970,3,1]],"date-time":"1970-03-01T00:00:00Z","timestamp":5097600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering"],"published-print":{"date-parts":[[1970,3]]},"DOI":"10.1016\/0025-5416(70)90087-x","type":"journal-article","created":{"date-parts":[[2003,6,21]],"date-time":"2003-06-21T03:13:16Z","timestamp":1056165196000},"page":"231-232","source":"Crossref","is-referenced-by-count":0,"title":["Materials Science Club Meeting on Materials in Leisure and Sport"],"prefix":"10.1016","volume":"5","member":"78","container-title":["Materials Science and Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:002554167090087X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:002554167090087X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T07:56:53Z","timestamp":1552982213000},"score":10.810511,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/002554167090087X"}},"issued":{"date-parts":[[1970,3]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1970,3]]}},"alternative-id":["002554167090087X"],"URL":"https:\/\/doi.org\/10.1016\/0025-5416(70)90087-x","ISSN":["0025-5416"],"issn-type":[{"value":"0025-5416","type":"print"}],"published":{"date-parts":[[1970,3]]}},{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T03:14:41Z","timestamp":1771989281508,"version":"3.50.1"},"reference-count":42,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["1711115S"],"award-info":[{"award-number":["1711115S"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["1805027S"],"award-info":[{"award-number":["1805027S"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["1809085S"],"award-info":[{"award-number":["1809085S"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2016B1029"],"award-info":[{"award-number":["2016B1029"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2016B1030"],"award-info":[{"award-number":["2016B1030"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2016B4900"],"award-info":[{"award-number":["2016B4900"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2016B4901"],"award-info":[{"award-number":["2016B4901"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2016B4906"],"award-info":[{"award-number":["2016B4906"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2017A4902"],"award-info":[{"award-number":["2017A4902"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["2018A0412"],"award-info":[{"award-number":["2018A0412"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["A-14-NM-0110"],"award-info":[{"award-number":["A-14-NM-0110"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["A-16-NM-0122"],"award-info":[{"award-number":["A-16-NM-0122"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004496","name":"National Institute for Materials Science","doi-asserted-by":"publisher","award":["A-16-NM-0127"],"award-info":[{"award-number":["A-16-NM-0127"]}],"id":[{"id":"10.13039\/501100004496","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["15K04616"],"award-info":[{"award-number":["15K04616"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["18K04868"],"award-info":[{"award-number":["18K04868"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Applied Surface Science"],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1016\/j.apsusc.2021.151943","type":"journal-article","created":{"date-parts":[[2021,11,27]],"date-time":"2021-11-27T02:05:50Z","timestamp":1637978750000},"page":"151943","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":9,"special_numbering":"C","title":["Electronic states of gallium oxide epitaxial thin films and related atomic arrangement"],"prefix":"10.1016","volume":"578","author":[{"given":"Yanna","family":"Chen","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2626-0161","authenticated-orcid":false,"given":"Osami","family":"Sakata","sequence":"additional","affiliation":[]},{"given":"Hiroyuki","family":"Morita","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8707-9094","authenticated-orcid":false,"given":"Akifumi","family":"Matsuda","sequence":"additional","affiliation":[]},{"given":"Fanhao","family":"Jia","sequence":"additional","affiliation":[]},{"given":"Okkyun","family":"Seo","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9160-6590","authenticated-orcid":false,"given":"Loku Singgappulige Rosantha","family":"Kumara","sequence":"additional","affiliation":[]},{"given":"Toshiaki","family":"Ina","sequence":"additional","affiliation":[]},{"given":"Eiichi","family":"Kobayashi","sequence":"additional","affiliation":[]},{"given":"Jaemyung","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Chulho","family":"Song","sequence":"additional","affiliation":[]},{"given":"Satoshi","family":"Hiroi","sequence":"additional","affiliation":[]},{"given":"Natalia","family":"Palina","sequence":"additional","affiliation":[]},{"given":"Yanfang","family":"Lou","sequence":"additional","affiliation":[]},{"given":"Wei","family":"Ren","sequence":"additional","affiliation":[]},{"given":"Mamoru","family":"Yoshimoto","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"issue":"4","key":"10.1016\/j.apsusc.2021.151943_b1","doi-asserted-by":"crossref","first-page":"383","DOI":"10.1038\/nmat4599","article-title":"Metal oxides for optoelectronic applications","volume":"15","author":"Yu","year":"2016","journal-title":"Nature Mater."},{"issue":"1","key":"10.1016\/j.apsusc.2021.151943_b2","doi-asserted-by":"crossref","DOI":"10.1063\/1.5006941","article-title":"A review of Ga2O3 materials, processing, and devices","volume":"5","author":"Pearton","year":"2018","journal-title":"Appl. Phys. Rev."},{"issue":"20","key":"10.1016\/j.apsusc.2021.151943_b3","doi-asserted-by":"crossref","DOI":"10.1063\/1.4879800","article-title":"High-voltage field effect transistors with wide-bandgap \u03b2-Ga2O3 nanomembranes","volume":"104","author":"Hwang","year":"2014","journal-title":"Appl. Phys. Lett."},{"issue":"1","key":"10.1016\/j.apsusc.2021.151943_b4","doi-asserted-by":"crossref","first-page":"24190","DOI":"10.1038\/srep24190","article-title":"Inhibition of unintentional extra carriers by Mn valence change for high insulating devices","volume":"6","author":"Guo","year":"2016","journal-title":"Sci. Rep."},{"issue":"7","key":"10.1016\/j.apsusc.2021.151943_b5","doi-asserted-by":"crossref","DOI":"10.1063\/1.4818620","article-title":"Deep ultraviolet photodiodes based on \u03b2-Ga2O3\/SiC heterojunction","volume":"103","author":"Nakagomi","year":"2013","journal-title":"Appl. Phys. Lett."},{"issue":"2","key":"10.1016\/j.apsusc.2021.151943_b6","doi-asserted-by":"crossref","first-page":"232","DOI":"10.1109\/LED.2013.2292080","article-title":"Ga2O3:ITO transparent conducting electrodes for near-ultraviolet light-emitting diodes","volume":"35","author":"Kim","year":"2014","journal-title":"IEEE Electron Device Lett."},{"issue":"27","key":"10.1016\/j.apsusc.2021.151943_b7","doi-asserted-by":"crossref","first-page":"4704","DOI":"10.1002\/adma.201401054","article-title":"Atomic layer deposited gallium oxide buffer layer enables 1.2 V open-circuit voltage in cuprous oxide solar cells","volume":"26","author":"Lee","year":"2014","journal-title":"Adv. Mater."},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b8","doi-asserted-by":"crossref","first-page":"719","DOI":"10.1021\/ja01123a039","article-title":"Polymorphism of Ga2O3 and the system Ga2O3\u2014H2O","volume":"74","author":"Roy","year":"1952","journal-title":"J. Am. Chem. Soc."},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b9","doi-asserted-by":"crossref","first-page":"676","DOI":"10.1063\/1.1731237","article-title":"Crystal structure of \u03b2-Ga2O3","volume":"33","author":"Geller","year":"1960","journal-title":"J. Chem. Phys."},{"issue":"42","key":"10.1016\/j.apsusc.2021.151943_b10","doi-asserted-by":"crossref","first-page":"28928","DOI":"10.1039\/C7CP03675B","article-title":"First-principles study of Ga-vacancy induced magnetism in \u03b2-Ga2O3","volume":"19","author":"Yang","year":"2017","journal-title":"Phys. Chem. Chem. Phys."},{"issue":"25","key":"10.1016\/j.apsusc.2021.151943_b11","doi-asserted-by":"crossref","first-page":"4166","DOI":"10.1063\/1.1330559","article-title":"Deep-ultraviolet transparent conductive \u03b2-Ga2O3 thin films","volume":"77","author":"Orita","year":"2000","journal-title":"Appl. Phys. Lett."},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b12","doi-asserted-by":"crossref","DOI":"10.1143\/APEX.5.035502","article-title":"Device-quality \u03b2-Ga2O3 epitaxial films fabricated by ozone molecular beam epitaxy","volume":"5","author":"Sasaki","year":"2012","journal-title":"Appl. Phys. Express"},{"issue":"24","key":"10.1016\/j.apsusc.2021.151943_b13","doi-asserted-by":"crossref","DOI":"10.1063\/1.4922814","article-title":"Electrical compensation by Ga vacancies in Ga2O3 thin films","volume":"106","author":"Korhonen","year":"2015","journal-title":"Appl. Phys. Lett."},{"issue":"7","key":"10.1016\/j.apsusc.2021.151943_b14","doi-asserted-by":"crossref","first-page":"3792","DOI":"10.1063\/1.371289","article-title":"Role of oxygen vacancy defect states in the n-type conduction of \u03b2-Ga2O3","volume":"86","author":"Hajnal","year":"1999","journal-title":"J. Appl. Phys."},{"key":"10.1016\/j.apsusc.2021.151943_b15","doi-asserted-by":"crossref","DOI":"10.1016\/j.jallcom.2019.152026","article-title":"The further investigation of N-doped \u03b2-Ga2O3 thin films with native defects for schottky-barrier diode","volume":"812","author":"Luan","year":"2020","journal-title":"J. Alloys Compd."},{"key":"10.1016\/j.apsusc.2021.151943_b16","doi-asserted-by":"crossref","first-page":"558","DOI":"10.1016\/j.matlet.2017.08.052","article-title":"Mg-doped p-type \u03b2-Ga2O3 thin film for solar-blind ultraviolet photodetector","volume":"209","author":"Qian","year":"2017","journal-title":"Mater. Lett."},{"issue":"7","key":"10.1016\/j.apsusc.2021.151943_b17","doi-asserted-by":"crossref","DOI":"10.1063\/1.4990454","article-title":"Electron paramagnetic resonance study of neutral Mg acceptors in \u03b2-Ga2O3 crystals","volume":"111","author":"Kananen","year":"2017","journal-title":"Appl. Phys. Lett."},{"issue":"7016","key":"10.1016\/j.apsusc.2021.151943_b18","doi-asserted-by":"crossref","first-page":"488","DOI":"10.1038\/nature03090","article-title":"Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors","volume":"432","author":"Nomura","year":"2004","journal-title":"Nature"},{"issue":"1","key":"10.1016\/j.apsusc.2021.151943_b19","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1038\/nmat2914","article-title":"Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a \u2018sol\u2013gel on chip\u2019 process","volume":"10","author":"Banger","year":"2011","journal-title":"Nature Mater."},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b20","doi-asserted-by":"crossref","DOI":"10.1038\/am.2017.20","article-title":"Conversion of an ultra-wide bandgap amorphous oxide insulator to a semiconductor","volume":"9","author":"Kim","year":"2017","journal-title":"NPG Asia Mater."},{"key":"10.1016\/j.apsusc.2021.151943_b21","doi-asserted-by":"crossref","first-page":"216","DOI":"10.1016\/j.actamat.2019.11.019","article-title":"In situ TEM study of \u03ba\u2192\u03b2 and \u03ba\u2192\u03b3 phase transformations in Ga2O3","volume":"183","author":"Cora","year":"2020","journal-title":"Acta Mater."},{"key":"10.1016\/j.apsusc.2021.151943_b22","doi-asserted-by":"crossref","first-page":"411","DOI":"10.1016\/j.actamat.2017.08.062","article-title":"Thermal stability of \u03b5-Ga2O3 polymorph","volume":"140","author":"Fornari","year":"2017","journal-title":"Acta Mater."},{"issue":"10","key":"10.1016\/j.apsusc.2021.151943_b23","doi-asserted-by":"crossref","DOI":"10.7567\/APEX.9.105502","article-title":"Room-temperature laser annealing for solid-phase epitaxial crystallization of \u03b2-Ga2O3 thin films","volume":"9","author":"Shiojiri","year":"2016","journal-title":"Appl. Phys. Express"},{"key":"10.1016\/j.apsusc.2021.151943_b24","doi-asserted-by":"crossref","first-page":"14385","DOI":"10.1038\/srep14385","article-title":"Layer matching epitaxy of NiO thin films on atomically stepped sapphire (0001) substrates","volume":"5","author":"Yamauchi","year":"2015","journal-title":"Sci. Rep."},{"issue":"24","key":"10.1016\/j.apsusc.2021.151943_b25","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.95.245301","article-title":"Lattice distortion and electronic structure of magnesium-doped nickel oxide epitaxial thin films","volume":"95","author":"Chen","year":"2017","journal-title":"Phys. Rev. B"},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b26","doi-asserted-by":"crossref","first-page":"689","DOI":"10.1002\/sia.3522","article-title":"Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range","volume":"43","author":"Tanuma","year":"2011","journal-title":"Surf. Int. Anal."},{"issue":"4","key":"10.1016\/j.apsusc.2021.151943_b27","doi-asserted-by":"crossref","first-page":"537","DOI":"10.1107\/S0909049505012719","article-title":"ATHENA,ARTEMIS,HEPHAESTUS: data analysis for X-ray absorption spectroscopy using IFEFFIT","volume":"12","author":"Ravel","year":"2005","journal-title":"J. Synchrotron Radiat."},{"issue":"3","key":"10.1016\/j.apsusc.2021.151943_b28","doi-asserted-by":"crossref","first-page":"1758","DOI":"10.1103\/PhysRevB.59.1758","article-title":"From ultrasoft pseudopotentials to the projector augmented-wave method","volume":"59","author":"Kresse","year":"1999","journal-title":"Phys. Rev. B"},{"key":"10.1016\/j.apsusc.2021.151943_b29","doi-asserted-by":"crossref","first-page":"11169","DOI":"10.1103\/PhysRevB.54.11169","article-title":"Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set","volume":"54","author":"Kresse","year":"1996","journal-title":"Phys. Rev. B"},{"issue":"18","key":"10.1016\/j.apsusc.2021.151943_b30","doi-asserted-by":"crossref","first-page":"3865","DOI":"10.1103\/PhysRevLett.77.3865","article-title":"Generalized gradient approximation made simple","volume":"77","author":"Perdew","year":"1996","journal-title":"Phys. Rev. Lett."},{"issue":"18","key":"10.1016\/j.apsusc.2021.151943_b31","doi-asserted-by":"crossref","first-page":"8207","DOI":"10.1063\/1.1564060","article-title":"Hybrid functionals based on a screened Coulomb potential","volume":"118","author":"Heyd","year":"2003","journal-title":"J. Chem. Phys."},{"issue":"1","key":"10.1016\/j.apsusc.2021.151943_b32","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1080\/10408439708241258","article-title":"Thin film and surface characterization by specular X-ray reflectivity","volume":"22","author":"Chason","year":"1997","journal-title":"Crit. Rev. Solid State Mater. Sci."},{"key":"10.1016\/j.apsusc.2021.151943_b33","doi-asserted-by":"crossref","first-page":"L113","DOI":"10.1143\/JJAP.31.L113","article-title":"Fourier analysis of interference structure in X-Ray specular reflection from thin films","volume":"31","author":"Sakurai","year":"1992","journal-title":"Japan. J. Appl. Phys."},{"key":"10.1016\/j.apsusc.2021.151943_b34","series-title":"Elements of Modern X-Ray Physics","author":"Als-Nielsen","year":"2011"},{"issue":"17","key":"10.1016\/j.apsusc.2021.151943_b35","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.86.174114","article-title":"Atomic structure relaxation in nanocrystalline NiO studied by exafs spectroscopy: Role of nickel vacancies","volume":"86","author":"Anspoks","year":"2012","journal-title":"Phys. Rev. B"},{"issue":"12","key":"10.1016\/j.apsusc.2021.151943_b36","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.81.125116","article-title":"Tuning the properties of complex transparent conducting oxides: Role of crystal symmetry, chemical composition, and carrier generation","volume":"81","author":"Medvedeva","year":"2010","journal-title":"Phys. Rev. B"},{"issue":"15","key":"10.1016\/j.apsusc.2021.151943_b37","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.85.155101","article-title":"Electronic properties of layered multicomponent wide-band-gap oxides: A combinatorial approach","volume":"85","author":"Murat","year":"2012","journal-title":"Phys. Rev. B"},{"key":"10.1016\/j.apsusc.2021.151943_b38","doi-asserted-by":"crossref","DOI":"10.1016\/j.apsusc.2020.148273","article-title":"Effect of ion irradiation on GaAs core-level electron binding energies and band structure","volume":"539","author":"Mikoushkin","year":"2021","journal-title":"Appl. Surf. Sci."},{"issue":"2","key":"10.1016\/j.apsusc.2021.151943_b39","doi-asserted-by":"crossref","first-page":"627","DOI":"10.1002\/pssb.19660150224","article-title":"Optical properties and electronic structure of amorphous germanium","volume":"15","author":"Tauc","year":"1966","journal-title":"Phys. Status Solidi b"},{"issue":"1","key":"10.1016\/j.apsusc.2021.151943_b40","doi-asserted-by":"crossref","first-page":"97","DOI":"10.1006\/adnd.2000.0849","article-title":"Photoelectron angular distribution parameters for elements Z=1 to Z=54 in the photoelectron energy range 100\u20135000 eV","volume":"77","author":"Trzhaskovskaya","year":"2001","journal-title":"At. Data Nucl. Data Tables"},{"issue":"2","key":"10.1016\/j.apsusc.2021.151943_b41","doi-asserted-by":"crossref","first-page":"245","DOI":"10.1016\/j.adt.2005.12.002","article-title":"Non-dipole second order parameters of the photoelectron angular distribution for elements Z=1\u2013100 in the photoelectron energy range 1\u201310 keV","volume":"92","author":"Trzhaskovskaya","year":"2006","journal-title":"At. Data Nucl. Data Tables"},{"key":"10.1016\/j.apsusc.2021.151943_b42","series-title":"Theoretical Photoionization Cross Sections from 1 to 1500 keV","author":"Scofield","year":"1973"}],"container-title":["Applied Surface Science"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0169433221029822?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0169433221029822?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2025,9,30]],"date-time":"2025-09-30T10:16:47Z","timestamp":1759227407000},"score":10.766148,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0169433221029822"}},"issued":{"date-parts":[[2022,3]]},"references-count":42,"alternative-id":["S0169433221029822"],"URL":"https:\/\/doi.org\/10.1016\/j.apsusc.2021.151943","ISSN":["0169-4332"],"issn-type":[{"value":"0169-4332","type":"print"}],"published":{"date-parts":[[2022,3]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Electronic states of gallium oxide epitaxial thin films and related atomic arrangement","name":"articletitle","label":"Article Title"},{"value":"Applied Surface Science","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.apsusc.2021.151943","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2021 The Authors. Published by Elsevier B.V.","name":"copyright","label":"Copyright"}],"article-number":"151943"},{"indexed":{"date-parts":[[2024,9,16]],"date-time":"2024-09-16T02:45:31Z","timestamp":1726454731224},"reference-count":0,"publisher":"Elsevier","isbn-type":[{"type":"print","value":"9780128035818"}],"license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[2016]]},"DOI":"10.1016\/b978-0-12-803581-8.04105-9","type":"book-chapter","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T21:14:55Z","timestamp":1448918095000},"source":"Crossref","is-referenced-by-count":1,"title":["Fundamental Materials Science"],"prefix":"10.1016","author":[{"given":"D.","family":"Diamond","sequence":"first","affiliation":[]}],"member":"78","container-title":["Reference Module in Materials Science and Materials Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818041059?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818041059?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2018,9,17]],"date-time":"2018-09-17T08:57:28Z","timestamp":1537174648000},"score":10.764271,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/B9780128035818041059"}},"issued":{"date-parts":[[2016]]},"ISBN":["9780128035818"],"references-count":0,"URL":"https:\/\/doi.org\/10.1016\/b978-0-12-803581-8.04105-9","published":{"date-parts":[[2016]]}},{"indexed":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T11:40:10Z","timestamp":1750765210269,"version":"3.41.0"},"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"8","license":[{"start":{"date-parts":[[2001,8,1]],"date-time":"2001-08-01T00:00:00Z","timestamp":996624000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2001,8,1]],"date-time":"2001-08-01T00:00:00Z","timestamp":996624000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Materials Science: Materials in Electronics"],"published-print":{"date-parts":[[2001,8]]},"DOI":"10.1023\/a:1011832529459","type":"journal-article","created":{"date-parts":[[2002,12,23]],"date-time":"2002-12-23T11:26:45Z","timestamp":1040642805000},"page":"3-3","source":"Crossref","is-referenced-by-count":0,"title":["Journal of Materials Science: Materials in Electronics August 2001"],"prefix":"10.1007","volume":"12","author":[{"given":"Peter","family":"Capper","sequence":"first","affiliation":[]}],"member":"297","container-title":["Journal of Materials Science: Materials in Electronics"],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011832529459.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1011832529459\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011832529459.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T11:10:16Z","timestamp":1750763416000},"score":10.761356,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1011832529459"}},"issued":{"date-parts":[[2001,8]]},"references-count":0,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2001,8]]}},"alternative-id":["359260"],"URL":"https:\/\/doi.org\/10.1023\/a:1011832529459","ISSN":["0957-4522","1573-482X"],"issn-type":[{"type":"print","value":"0957-4522"},{"type":"electronic","value":"1573-482X"}],"published":{"date-parts":[[2001,8]]}},{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T23:59:31Z","timestamp":1725839971769},"reference-count":0,"publisher":"Elsevier","isbn-type":[{"type":"print","value":"9780128035818"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[2019]]},"DOI":"10.1016\/b978-0-12-803581-8.09013-5","type":"book-chapter","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T21:20:54Z","timestamp":1448918454000},"source":"Crossref","is-referenced-by-count":0,"title":["OBSOLETE: Reference Module in Materials Science and Materials Engineering \u2013 Editorial Board"],"prefix":"10.1016","member":"78","container-title":["Reference Module in Materials Science and Materials Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818090135?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818090135?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,9,23]],"date-time":"2019-09-23T21:53:16Z","timestamp":1569275596000},"score":10.756612,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/B9780128035818090135"}},"issued":{"date-parts":[[2019]]},"ISBN":["9780128035818"],"references-count":0,"URL":"https:\/\/doi.org\/10.1016\/b978-0-12-803581-8.09013-5","published":{"date-parts":[[2019]]}},{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T18:30:06Z","timestamp":1648665006940},"reference-count":0,"publisher":"Science & Technology","issue":"10","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science"],"published-print":{"date-parts":[[2018]]},"DOI":"10.31044\/1684-579x-2018-0-10","type":"journal-issue","created":{"date-parts":[[2018,12,12]],"date-time":"2018-12-12T11:12:29Z","timestamp":1544613149000},"source":"Crossref","is-referenced-by-count":0,"prefix":"10.31044","volume":"0","member":"16041","published-online":{"date-parts":[[2018]]},"container-title":["Materials Science"],"deposited":{"date-parts":[[2018,12,12]],"date-time":"2018-12-12T11:12:29Z","timestamp":1544613149000},"score":10.703703,"resource":{"primary":{"URL":"http:\/\/www.nait.ru\/journals\/number.php?p_number_id=2836"}},"issued":{"date-parts":[[2018]]},"references-count":0,"journal-issue":{"issue":"10","published-online":{"date-parts":[[2018]]},"published-print":{"date-parts":[[2018]]}},"URL":"https:\/\/doi.org\/10.31044\/1684-579x-2018-0-10","ISSN":["1684-579X"],"issn-type":[{"value":"1684-579X","type":"print"}],"published":{"date-parts":[[2018]]}},{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T23:57:45Z","timestamp":1725839865368},"reference-count":0,"publisher":"Elsevier","isbn-type":[{"type":"print","value":"9780128035818"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[2019]]},"DOI":"10.1016\/b978-0-12-803581-8.09021-4","type":"book-chapter","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T21:02:48Z","timestamp":1448917368000},"source":"Crossref","is-referenced-by-count":0,"title":["OBSOLETE: Reference Module in Materials Science and Materials Engineering \u2013 Editor\u2019s Note"],"prefix":"10.1016","member":"78","container-title":["Reference Module in Materials Science and Materials Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818090214?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780128035818090214?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,9,23]],"date-time":"2019-09-23T21:53:17Z","timestamp":1569275597000},"score":10.694647,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/B9780128035818090214"}},"issued":{"date-parts":[[2019]]},"ISBN":["9780128035818"],"references-count":0,"URL":"https:\/\/doi.org\/10.1016\/b978-0-12-803581-8.09021-4","published":{"date-parts":[[2019]]}},{"indexed":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T05:02:39Z","timestamp":1709269359328},"reference-count":0,"publisher":"Elsevier BV","issue":"4","license":[{"start":{"date-parts":[[1992,2,1]],"date-time":"1992-02-01T00:00:00Z","timestamp":696902400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering: B"],"published-print":{"date-parts":[[1992,2]]},"DOI":"10.1016\/0921-5107(92)90012-x","type":"journal-article","created":{"date-parts":[[2003,3,15]],"date-time":"2003-03-15T04:47:05Z","timestamp":1047703625000},"page":"393","source":"Crossref","is-referenced-by-count":1,"title":["Materials science and engineering"],"prefix":"10.1016","volume":"12","member":"78","container-title":["Materials Science and Engineering: B"],"language":"en","link":[{"URL":"http:\/\/api.elsevier.com\/content\/article\/PII:092151079290012X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/api.elsevier.com\/content\/article\/PII:092151079290012X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2015,9,21]],"date-time":"2015-09-21T20:45:09Z","timestamp":1442868309000},"score":10.694212,"resource":{"primary":{"URL":"http:\/\/linkinghub.elsevier.com\/retrieve\/pii\/092151079290012X"}},"issued":{"date-parts":[[1992,2]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1992,2]]}},"alternative-id":["092151079290012X"],"URL":"https:\/\/doi.org\/10.1016\/0921-5107(92)90012-x","ISSN":["0921-5107"],"issn-type":[{"value":"0921-5107","type":"print"}],"published":{"date-parts":[[1992,2]]}},{"indexed":{"date-parts":[[2026,3,8]],"date-time":"2026-03-08T23:55:36Z","timestamp":1773014136306,"version":"3.50.1"},"reference-count":28,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2015,4,30]],"date-time":"2015-04-30T00:00:00Z","timestamp":1430352000000},"content-version":"vor","delay-in-days":119,"URL":"http:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Procedia Materials Science"],"published-print":{"date-parts":[[2015]]},"DOI":"10.1016\/j.mspro.2015.04.014","type":"journal-article","created":{"date-parts":[[2015,7,2]],"date-time":"2015-07-02T16:21:29Z","timestamp":1435854089000},"page":"113-122","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":45,"special_numbering":"C","title":["Raman Scattering Applied to Materials Science"],"prefix":"10.1016","volume":"9","author":[{"given":"Andr\u00e9s","family":"Cantarero","sequence":"first","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/j.mspro.2015.04.014_bib0005","doi-asserted-by":"crossref","first-page":"7529","DOI":"10.1103\/PhysRevB.41.7529","article-title":"Piezo-Raman measurements and anharmonic parameters in silicon and diamond","volume":"41","author":"Anastassakis","year":"1990","journal-title":"Physical Review B"},{"key":"10.1016\/j.mspro.2015.04.014_bib0010","first-page":"5965","article-title":"Feynman diagrams and Fano interference in light scattering from doped semiconductors","volume":"9","author":"Belitsky","year":"1997","journal-title":"Journal of Physics: Condensed Matter"},{"key":"10.1016\/j.mspro.2015.04.014_bib0015","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1051\/anphys\/192209170088","article-title":"Diffusion de la lumire et des rayons X par un corps transparent homogne","volume":"17","author":"Brillouin","year":"1922","journal-title":"Influence de ragitation thermique. Annales de Physique"},{"key":"10.1016\/j.mspro.2015.04.014_bib0020","first-page":"739","article-title":"Vibrational properties of ZnTe at high pressures","volume":"14","author":"Camacho","year":"2002","journal-title":"Journal of Physics: Condensed Matter"},{"key":"10.1016\/j.mspro.2015.04.014_bib0025","author":"Cantarero","year":"2012","journal-title":"Optical techniques for nanostructure characterization, from Encyclopedia of Nanotechnology (Vol 3), B. Bhushan Springer"},{"key":"10.1016\/j.mspro.2015.04.014_bib0030","first-page":"071598","volume":"7","author":"Cantarero","year":"2013","journal-title":"Review of Raman scattering in semiconductor nanowires: I. Theory, Journal of Nanophotonics"},{"key":"10.1016\/j.mspro.2015.04.014_bib0035","author":"Cantarero","year":"1989","journal-title":"Excitons in one phonon resonant Raman scattering: Deformation potential interaction. Physical Review B 39, 8388-8397;"},{"key":"10.1016\/j.mspro.2015.04.014_bib0040","first-page":"1789","article-title":"Polar optical oscillations in quantum wires and free standing wires: - The electron- phonon interaction Hamiltonian","volume":"7","author":"Comas","year":"1995","journal-title":"Journal of Physics: Condensed Matter"},{"key":"10.1016\/j.mspro.2015.04.014_bib0045","doi-asserted-by":"crossref","first-page":"1866","DOI":"10.1103\/PhysRev.124.1866","article-title":"Effects of configuration interaction on intensities and phase shifts","volume":"124","author":"Fano","year":"1961","journal-title":"Physical Review"},{"key":"10.1016\/j.mspro.2015.04.014_bib0050","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1590\/S0103-97331998000100002","article-title":"Optical studies of wide bandgap carbide and nitride semiconductors","volume":"28","author":"Freitas","year":"1998","journal-title":"Brazilian Journal of Physics"},{"key":"10.1016\/j.mspro.2015.04.014_bib0055","doi-asserted-by":"crossref","first-page":"011101","DOI":"10.1063\/1.1977210","article-title":"Reduction of the internal electric field in wurtzite a-plane self-assembled quantum dots","volume":"87","author":"Garro","year":"2009","journal-title":"Applied Physics Letters"},{"key":"10.1016\/j.mspro.2015.04.014_bib0060","doi-asserted-by":"crossref","first-page":"10694","DOI":"10.1021\/nn504407z","article-title":"Hierarchical Self-Assembly of Gold Nanoparticles into Patterned Plasmonic Nanostructures","volume":"8","author":"Hamon","year":"2014","journal-title":"ACS Nano"},{"key":"10.1016\/j.mspro.2015.04.014_bib0065","article-title":"Electronic Raman scattering, in \u201cLight Scattering in Solids I\u201d","author":"Klein","year":"1983","journal-title":"Ed. M. Cardona. Springer"},{"key":"10.1016\/j.mspro.2015.04.014_bib0070","first-page":"557","article-title":"Eine neue Erscheinung bei der Lichtzerstreuung in Krystallen","volume":"16","author":"Lanberg","year":"1928","journal-title":"Naturwissenschaften Loudon, R.,;1; 1963. Theory of the first order Raman effect in crystals. Proceedings of the Royal Society A 275"},{"key":"10.1016\/j.mspro.2015.04.014_bib0075","first-page":"575","volume":"122","author":"Olguin","year":"2002","journal-title":"Electron-phonon effects on the direct band gap in semiconductors: LCAO calculations. Solid State Communications (Review)"},{"key":"10.1016\/j.mspro.2015.04.014_bib0080","doi-asserted-by":"crossref","first-page":"085318","DOI":"10.1103\/PhysRevB.84.085318","article-title":"Polarized and resonant Raman spectroscopy on single InAs nanowires","volume":"84","author":"M\u00f6ller","year":"2011","journal-title":"Physical Review B"},{"key":"10.1016\/j.mspro.2015.04.014_bib0085","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1007\/s12274-008-8036-1","article-title":"Raman spectroscopy and imaging of graphene","volume":"1","author":"Ni","year":"2008","journal-title":"Nano Research"},{"key":"10.1016\/j.mspro.2015.04.014_bib0090","first-page":"387","article-title":"Tip-enhanced Raman mapping of single Ge nanowires Applied Physics Letters 99 053112","volume":"2","author":"Ogawa","year":"2011","journal-title":"Raman, C.V.,;1; 1928. A new radiation. Indian Journal of Physics"},{"key":"10.1016\/j.mspro.2015.04.014_bib0095","doi-asserted-by":"crossref","first-page":"233116","DOI":"10.1063\/1.3040681","article-title":"Surface optical Raman modes in InN nanostructures","volume":"93","author":"Sahoo","year":"2008","journal-title":"Applied Physics Letters"},{"key":"10.1016\/j.mspro.2015.04.014_bib0100","doi-asserted-by":"crossref","first-page":"115305","DOI":"10.1103\/PhysRevB.79.115305","article-title":"Optical studies of MBE-grown InN nanocolumns: evidence of an electron accumulation layer","volume":"79","author":"Segura-Ruiz","year":"2009","journal-title":"Physical Review B"},{"key":"10.1016\/j.mspro.2015.04.014_bib0105","doi-asserted-by":"crossref","first-page":"873","DOI":"10.1007\/BF01576902","article-title":"Zur Quantentheorie der Dispersion","volume":"11","author":"Smekal","year":"1923","journal-title":"Naturwissenschaften"},{"key":"10.1016\/j.mspro.2015.04.014_bib0110","author":"Sorkin","year":"2014","journal-title":"Nanoscale transition metal dichalcogenides: structures, properties and applications"},{"key":"10.1016\/j.mspro.2015.04.014_bib0115","doi-asserted-by":"crossref","unstructured":"Critical Reviews in Solid State and Materials Sciences 39, 319-367.","DOI":"10.1080\/10408436.2013.863176"},{"key":"10.1016\/j.mspro.2015.04.014_bib0120","unstructured":"Tenne, D.A., Bruchhausen, A., Lanzillotti-Kimura, N.D., Fainstein, A., Katiyar, R.S., Cantarero, A., Soukiassian, A., Vaithyanathan, V., Haeni,."},{"key":"10.1016\/j.mspro.2015.04.014_bib0125","doi-asserted-by":"crossref","first-page":"1614","DOI":"10.1126\/science.1130306","article-title":"Probing nanoscale ferroelectricity by ultraviolet spectroscopy","volume":"313","author":"Tian","year":"2006","journal-title":"Science"},{"key":"10.1016\/j.mspro.2015.04.014_bib0130","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1002\/pssb.2221980117","article-title":"Vibrational properties of InSe under pressure: Experiment and theory","volume":"198","author":"Ulrich","year":"1996","journal-title":"Physica Status Solidi B"},{"key":"10.1016\/j.mspro.2015.04.014_bib0135","doi-asserted-by":"crossref","first-page":"133101","DOI":"10.1063\/1.4869555","article-title":"Defect spectroscopy of single ZnO microwires","volume":"115","author":"Villafuerte","year":"2014","journal-title":"Journal of Applied Physics"},{"key":"10.1016\/j.mspro.2015.04.014_bib0140","doi-asserted-by":"crossref","first-page":"381","DOI":"10.1016\/S0921-4526(98)01390-8","article-title":"Raman studies of isotope effects in Si and GaAs","volume":"263","author":"Widulle","year":"1999","journal-title":"Physica B"}],"container-title":["Procedia Materials Science"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S2211812815000152?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S2211812815000152?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,8,27]],"date-time":"2019-08-27T22:59:53Z","timestamp":1566946793000},"score":10.668154,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S2211812815000152"}},"issued":{"date-parts":[[2015]]},"references-count":28,"alternative-id":["S2211812815000152"],"URL":"https:\/\/doi.org\/10.1016\/j.mspro.2015.04.014","ISSN":["2211-8128"],"issn-type":[{"value":"2211-8128","type":"print"}],"published":{"date-parts":[[2015]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Raman Scattering Applied to Materials Science","name":"articletitle","label":"Article Title"},{"value":"Procedia Materials Science","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.mspro.2015.04.014","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2015 The Authors. Published by Elsevier Ltd.","name":"copyright","label":"Copyright"}]},{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T22:32:26Z","timestamp":1761517946067},"reference-count":0,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[1974,4,1]],"date-time":"1974-04-01T00:00:00Z","timestamp":134006400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering"],"published-print":{"date-parts":[[1974,4]]},"DOI":"10.1016\/0025-5416(74)90116-5","type":"journal-article","created":{"date-parts":[[2003,6,21]],"date-time":"2003-06-21T07:13:16Z","timestamp":1056179596000},"page":"1-2","source":"Crossref","is-referenced-by-count":7,"title":["Materials science and engineering"],"prefix":"10.1016","volume":"14","author":[{"given":"Hugh","family":"Ford","sequence":"first","affiliation":[]}],"member":"78","container-title":["Materials Science and Engineering"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0025541674901165?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0025541674901165?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T12:28:02Z","timestamp":1552998482000},"score":10.662893,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0025541674901165"}},"issued":{"date-parts":[[1974,4]]},"references-count":0,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1974,4]]}},"alternative-id":["0025541674901165"],"URL":"https:\/\/doi.org\/10.1016\/0025-5416(74)90116-5","ISSN":["0025-5416"],"issn-type":[{"value":"0025-5416","type":"print"}],"published":{"date-parts":[[1974,4]]}},{"indexed":{"date-parts":[[2024,9,13]],"date-time":"2024-09-13T14:32:08Z","timestamp":1726237928575},"reference-count":0,"publisher":"Trans Tech Publications Ltd","isbn-type":[{"type":"electronic","value":"9783035705386"}],"content-domain":{"domain":[],"crossmark-restriction":false},"DOI":"10.4028\/b-i0arql","type":"book","created":{"date-parts":[[2023,11,23]],"date-time":"2023-11-23T08:22:15Z","timestamp":1700727735000},"source":"Crossref","is-referenced-by-count":1,"title":["Lasers in Materials Science"],"prefix":"10.4028","author":[{"given":"R.P.","family":"Agarwala","sequence":"first","affiliation":[]}],"member":"2457","published-online":{"date-parts":[[1999,1,4]]},"container-title":["Materials Science Forum"],"language":"en","deposited":{"date-parts":[[2023,11,23]],"date-time":"2023-11-23T08:22:18Z","timestamp":1700727738000},"score":10.6611805,"resource":{"primary":{"URL":"https:\/\/www.scientific.net\/book\/lasers-in-materials-science\/978-3-0357-0538-6"}},"subtitle":[""],"issued":{"date-parts":[[1999,1,4]]},"ISBN":["9783035705386"],"references-count":0,"URL":"https:\/\/doi.org\/10.4028\/b-i0arql","published":{"date-parts":[[1999,1,4]]}},{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T15:07:58Z","timestamp":1648912078904},"reference-count":0,"publisher":"Elsevier BV","issue":"4","license":[{"start":{"date-parts":[[1992,2,1]],"date-time":"1992-02-01T00:00:00Z","timestamp":696902400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering: B"],"published-print":{"date-parts":[[1992,2]]},"DOI":"10.1016\/0921-5107(92)90013-y","type":"journal-article","created":{"date-parts":[[2008,1,26]],"date-time":"2008-01-26T18:31:48Z","timestamp":1201372308000},"page":"393","source":"Crossref","is-referenced-by-count":0,"title":["Materials science and engineering"],"prefix":"10.1016","volume":"12","member":"78","container-title":["Materials Science and Engineering: B"],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:092151079290013Y?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:092151079290013Y?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,1,8]],"date-time":"2019-01-08T21:54:21Z","timestamp":1546984461000},"score":10.657858,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/092151079290013Y"}},"issued":{"date-parts":[[1992,2]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1992,2]]}},"alternative-id":["092151079290013Y"],"URL":"https:\/\/doi.org\/10.1016\/0921-5107(92)90013-y","ISSN":["0921-5107"],"issn-type":[{"value":"0921-5107","type":"print"}],"published":{"date-parts":[[1992,2]]}}],"items-per-page":20,"query":{"start-index":0,"search-terms":"Materials+Science"}}}